Pest-infested Soybean Leaf Image Classification with Deep Learning Techniques for Integrated Pest Management (IPM)

التفاصيل البيبلوغرافية
العنوان: Pest-infested Soybean Leaf Image Classification with Deep Learning Techniques for Integrated Pest Management (IPM)
المؤلفون: Chetan Badgujar, Hasib Mansur, Daniel Flippo
المصدر: 2022 Houston, Texas July 17-20, 2022.
بيانات النشر: American Society of Agricultural and Biological Engineers, 2022.
سنة النشر: 2022
DOI: 10.13031/aim.202201096
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::50555e1e565fa222e8d24562e1c1273a
https://doi.org/10.13031/aim.202201096
رقم الانضمام: edsair.doi...........50555e1e565fa222e8d24562e1c1273a
قاعدة البيانات: OpenAIRE