LITESCOPE™ AFM-IN-SEM: ADVANCED TOOL FOR CORRELATIVE IMAGING AND SURFACE CHARACTERIZATION
| العنوان: | LITESCOPE™ AFM-IN-SEM: ADVANCED TOOL FOR CORRELATIVE IMAGING AND SURFACE CHARACTERIZATION |
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| المؤلفون: | Jan Neuman, Veronika Novotná, Lukáš Flajsman, Veronika Hegrova, Zdeněk Novaček |
| المصدر: | NANOCON 2019 Conference Proeedings. |
| بيانات النشر: | TANGER Ltd., 2020. |
| سنة النشر: | 2020 |
| مصطلحات موضوعية: | Materials science, Atomic force microscopy, Nanotechnology, Correlative imaging, Characterization (materials science) |
| تدمد: | 2694-930X |
| DOI: | 10.37904/nanocon.2019.8655 |
| URL الوصول: | https://explore.openaire.eu/search/publication?articleId=doi_________::4ea9f17033bacd231cc9084f9b3f2637 https://doi.org/10.37904/nanocon.2019.8655 |
| Rights: | OPEN |
| رقم الانضمام: | edsair.doi...........4ea9f17033bacd231cc9084f9b3f2637 |
| قاعدة البيانات: | OpenAIRE |
| تدمد: | 2694930X |
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| DOI: | 10.37904/nanocon.2019.8655 |