Pulse Shape Measurements by On-Chip Sense Amplifiers of Single Event Transients Propagating Through a 90 nm Bulk CMOS Inverter Chain
العنوان: | Pulse Shape Measurements by On-Chip Sense Amplifiers of Single Event Transients Propagating Through a 90 nm Bulk CMOS Inverter Chain |
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المؤلفون: | Horst Zimmermann, Michael Hofbauer, Kurt Schweiger, B. Merk, K-O Voss, H. Dietrich, Andreas Steininger, Ulrich Schmid |
المصدر: | IEEE Transactions on Nuclear Science. 59:2778-2784 |
بيانات النشر: | Institute of Electrical and Electronics Engineers (IEEE), 2012. |
سنة النشر: | 2012 |
مصطلحات موضوعية: | Physics, Nuclear and High Energy Physics, business.industry, Amplifier, Electrical engineering, Sense (electronics), Pulse (physics), Optics, Nuclear Energy and Engineering, CMOS, Distortion, Inverter, Node (circuits), Transient (oscillation), Electrical and Electronic Engineering, Nuclear Experiment, business |
الوصف: | Single event transient (SET) pulse shapes caused by Au ions with an energy of 946 MeV were measured at the microprobe facility at GSI in Darmstadt. Using on-chip sense amplifiers, our novel approach allows observing SET pulse shapes at any interesting circuit node with negligible distortion. We were hence able to accurately trace the propagation of SET pulses through a 90 nm CMOS inverter chain. |
تدمد: | 1558-1578 0018-9499 |
DOI: | 10.1109/tns.2012.2223233 |
URL الوصول: | https://explore.openaire.eu/search/publication?articleId=doi_________::3d700c5a8a12b4462a803bdb1726288b https://doi.org/10.1109/tns.2012.2223233 |
Rights: | CLOSED |
رقم الانضمام: | edsair.doi...........3d700c5a8a12b4462a803bdb1726288b |
قاعدة البيانات: | OpenAIRE |
تدمد: | 15581578 00189499 |
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DOI: | 10.1109/tns.2012.2223233 |