Pulse Shape Measurements by On-Chip Sense Amplifiers of Single Event Transients Propagating Through a 90 nm Bulk CMOS Inverter Chain

التفاصيل البيبلوغرافية
العنوان: Pulse Shape Measurements by On-Chip Sense Amplifiers of Single Event Transients Propagating Through a 90 nm Bulk CMOS Inverter Chain
المؤلفون: Horst Zimmermann, Michael Hofbauer, Kurt Schweiger, B. Merk, K-O Voss, H. Dietrich, Andreas Steininger, Ulrich Schmid
المصدر: IEEE Transactions on Nuclear Science. 59:2778-2784
بيانات النشر: Institute of Electrical and Electronics Engineers (IEEE), 2012.
سنة النشر: 2012
مصطلحات موضوعية: Physics, Nuclear and High Energy Physics, business.industry, Amplifier, Electrical engineering, Sense (electronics), Pulse (physics), Optics, Nuclear Energy and Engineering, CMOS, Distortion, Inverter, Node (circuits), Transient (oscillation), Electrical and Electronic Engineering, Nuclear Experiment, business
الوصف: Single event transient (SET) pulse shapes caused by Au ions with an energy of 946 MeV were measured at the microprobe facility at GSI in Darmstadt. Using on-chip sense amplifiers, our novel approach allows observing SET pulse shapes at any interesting circuit node with negligible distortion. We were hence able to accurately trace the propagation of SET pulses through a 90 nm CMOS inverter chain.
تدمد: 1558-1578
0018-9499
DOI: 10.1109/tns.2012.2223233
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3d700c5a8a12b4462a803bdb1726288b
https://doi.org/10.1109/tns.2012.2223233
Rights: CLOSED
رقم الانضمام: edsair.doi...........3d700c5a8a12b4462a803bdb1726288b
قاعدة البيانات: OpenAIRE
الوصف
تدمد:15581578
00189499
DOI:10.1109/tns.2012.2223233