التفاصيل البيبلوغرافية
| العنوان: |
Precise Measurement of Ge Depth Profiles in SiGe HBT's - a Comparison of Different Methods |
| المؤلفون: |
O. Fursenko, Peter Zaumseil, Peter Formanek, R. Kurps, D. Krüger |
| المصدر: |
Solid State Phenomena. :473-482 |
| بيانات النشر: |
Trans Tech Publications, Ltd., 2003. |
| سنة النشر: |
2003 |
| مصطلحات موضوعية: |
X-ray reflectivity, Optics, Materials science, business.industry, Heterojunction bipolar transistor, Optoelectronics, General Materials Science, Condensed Matter Physics, business, Atomic and Molecular Physics, and Optics |
| تدمد: |
1662-9779 |
| DOI: |
10.4028/www.scientific.net/ssp.95-96.473 |
| URL الوصول: |
https://explore.openaire.eu/search/publication?articleId=doi_________::363f289447b90f182576be877c75e411
https://doi.org/10.4028/www.scientific.net/ssp.95-96.473 |
| Rights: |
CLOSED |
| رقم الانضمام: |
edsair.doi...........363f289447b90f182576be877c75e411 |
| قاعدة البيانات: |
OpenAIRE |