Physics of Hot Carrier Degradation Under Off-State Mode Operation in High Performance NPN SiGe HBTs

التفاصيل البيبلوغرافية
العنوان: Physics of Hot Carrier Degradation Under Off-State Mode Operation in High Performance NPN SiGe HBTs
المؤلفون: Dimitris P. Ioannou, Uppili S. Raghunathan, Dave Brochu, Adam Divergilio, Vibhor Jain, John J. Pekarik
المصدر: 2021 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS).
بيانات النشر: IEEE, 2021.
سنة النشر: 2021
DOI: 10.1109/bcicts50416.2021.9682453
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0e1505a14d5128361d7dbc6d238ade82
https://doi.org/10.1109/bcicts50416.2021.9682453
Rights: CLOSED
رقم الانضمام: edsair.doi...........0e1505a14d5128361d7dbc6d238ade82
قاعدة البيانات: OpenAIRE
الوصف
DOI:10.1109/bcicts50416.2021.9682453