Analysis of the Degradation Mechanism during Repeated Overwrite of Phase-Change Discs

التفاصيل البيبلوغرافية
العنوان: Analysis of the Degradation Mechanism during Repeated Overwrite of Phase-Change Discs
المؤلفون: Marcel A. Verheijen, A. E. Ton Kuiper, Corrie W. T. Bulle-Lieuwma, George J. Y. Zhong, Donato Pasquariello, Harry A. G. Nulens, Monja Kaiser, Liesbeth Van Pieterson
المصدر: Japanese Journal of Applied Physics. 46:1037-1041
بيانات النشر: IOP Publishing, 2007.
سنة النشر: 2007
مصطلحات موضوعية: Void (astronomy), Materials science, Physics and Astronomy (miscellaneous), business.industry, General Engineering, General Physics and Astronomy, law.invention, Phase change, Optics, DVD-RW, law, Dielectric layer, Optoelectronics, Electron microscope, business, Optical disc, Jitter
الوصف: Rewritable optical digital versatile discs (DVDs) were analyzed to identify alterations in layer composition after repeated overwrite cycles. Elemental depth profiling revealed the presence of S in the phase-change layer in areas with high jitter values. This we relate to a decomposition of the ZnS:SiO2 dielectric layer during repeated overwrite. The S concentration in the phase-change layer at the location of the repeatedly overwritten tracks is estimated to range between 0.1 and 1 at. %, depending on whether or not a caplayer is present between the ZnS:SiO2 layer and the phase-change layer. From electron microscope images we established that repeated overwrite cycles induce voids in the phase-change layer. By analyzing the repeatedly overwritten areas of various recording stacks we collected evidence that a caplayer may suppress void formation. Both S diffusion and void formation will limit the overwrite cyclability of optical discs, which explains the frequently reported beneficial effect of a caplayer on overwrite performance.
تدمد: 1347-4065
0021-4922
DOI: 10.1143/jjap.46.1037
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0a3c69c3b0795b1172009b95ad925f0e
https://doi.org/10.1143/jjap.46.1037
رقم الانضمام: edsair.doi...........0a3c69c3b0795b1172009b95ad925f0e
قاعدة البيانات: OpenAIRE
الوصف
تدمد:13474065
00214922
DOI:10.1143/jjap.46.1037