Investigation of Safe Operating Area on 4H-SiC 600V VDMOSFET with TLP and UIS Test Methods
| العنوان: | Investigation of Safe Operating Area on 4H-SiC 600V VDMOSFET with TLP and UIS Test Methods |
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| المؤلفون: | Chao-Yang Ke, Yu-Chia Tsui, Bing-Yue Tsui, Ming-Dou Ker |
| المصدر: | 2023 IEEE International Reliability Physics Symposium (IRPS). |
| بيانات النشر: | IEEE, 2023. |
| سنة النشر: | 2023 |
| DOI: | 10.1109/irps48203.2023.10118299 |
| URL الوصول: | https://explore.openaire.eu/search/publication?articleId=doi_________::07df3155df8aea89716f1085bcd3ad0c https://doi.org/10.1109/irps48203.2023.10118299 |
| Rights: | CLOSED |
| رقم الانضمام: | edsair.doi...........07df3155df8aea89716f1085bcd3ad0c |
| قاعدة البيانات: | OpenAIRE |
| DOI: | 10.1109/irps48203.2023.10118299 |
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