ADI to in-cell overlay stability improvement for DRAM using novel scatterometry and comprehensive process control

التفاصيل البيبلوغرافية
العنوان: ADI to in-cell overlay stability improvement for DRAM using novel scatterometry and comprehensive process control
المؤلفون: Robinson, John C., Sendelbach, Matthew J., Kim, Hyunsok, Ju, Jaewuk, Jeong, Ikhyun, Hong, Baikkyu, Nam, Sunouk, Lee, Changkyu, Lee, Kangmin, Jang, Sumin, Lee, Jaeyoun, Yang, Hongcheon, Jeong, Minho, Kim, Mingyu, Su, Hongpeng, Zhou, Wayne, Oh, Nanglyeom, Choi, Dongsub, Yaziv, Tal, Spielberg, Hedvi, Bachar, Ohad, Milo, Renan, Dirawi, Rawi
المصدر: Proceedings of SPIE; April 2023, Vol. 12496 Issue: 1 p124962E-124962E-9, 1124668p
قاعدة البيانات: Supplemental Index
الوصف
تدمد:0277786X
DOI:10.1117/12.2657632