Periodical
In situ formation of a new Al-Pd-Mn-Si quasicrystalline phase on the pentagonal surface of the Al-Pd-Mn quasicrystal
| العنوان: | In situ formation of a new Al-Pd-Mn-Si quasicrystalline phase on the pentagonal surface of the Al-Pd-Mn quasicrystal |
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| المؤلفون: | Longchamp, J.-N., Erbudak, M., Weisskopf, Y. |
| المصدر: | Journal de Physique IV - Proceedings; March 2006, Vol. 132 Issue: 1 p117-120, 4p |
| مستخلص: | Growth of thin Si films deposited on the 5-fold symmetry surface of the icosahedral Al-Pd-Mn quasicrystal is monitored by low-energy electron diffraction, secondary-electron imaging, and Auger electron spectroscopy. We observe that below a sample temperature of 370?K, Si grows in an amorphous structure. Above 370?K, a new Al-Pd-Mn-Si quasicrystalline phase, which exhibits the same icosahedral symmetry as the substrate, is formed at the surface by substitutionally replacing Al by absorbed Si. |
| قاعدة البيانات: | Supplemental Index |
| تدمد: | 11554339 17647177 |
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