Academic Journal

Quantitative Compositional Profiling of Conjugated Quantum Dots with Single Atomic Layer Depth Resolution via Time-of-Flight Medium-Energy Ion Scattering Spectroscopy.

التفاصيل البيبلوغرافية
العنوان: Quantitative Compositional Profiling of Conjugated Quantum Dots with Single Atomic Layer Depth Resolution via Time-of-Flight Medium-Energy Ion Scattering Spectroscopy.
المؤلفون: Kang-Won Jung, Hyunung Yu, Won Ja Min, Kyu-Sang Yu, Sortica, M. A., Grande, Pedro L., DaeWon Moon
المصدر: Analytical Chemistry; 1/21/2014, Vol. 86 Issue 2, p1091-1097, 7p
قاعدة البيانات: Supplemental Index
الوصف
تدمد:00032700
DOI:10.1021/ac402753j