In Situ TEM and Energy Dispersion Spectrometer Analysis of Chemical Composition Change in ZnO Nanowire Resistive Memories.

التفاصيل البيبلوغرافية
العنوان:	In Situ TEM and Energy Dispersion Spectrometer Analysis of Chemical Composition Change in ZnO Nanowire Resistive Memories.
المؤلفون:	Yu-Ting Huang, Shih-Ying Yu, Cheng-Lun Hsin, Chun-Wei Huang, Chen-Fang Kang, Fu-Hsuan Chu, Jui-Yuan Chen, Jung-Chih Hu, Lien-Tai Chen, Jr-Hau He, Wen-Wei Wu
المصدر:	Analytical Chemistry; 4/16/2013, Vol. 85 Issue 8, p3955-3960, 6p
قاعدة البيانات:	Supplemental Index

الوصف
تدمد:	00032700
DOI:	10.1021/ac303528m