التفاصيل البيبلوغرافية
| العنوان: |
Synchrotron X-ray tests of an L-shaped laterally graded multilayer mirror for the analyzer system of the ultra-high-resolution IXS spectrometer at NSLS-II. |
| المؤلفون: |
Honnicke, Marcelo G., Keister, Jeffrey W., Conley, Raymond, Kaznatcheev, Konstantine, Takacs, Peter Z., Coburn, David Scott, Reffi, Leo, Cai, Yong Q. |
| المصدر: |
Journal of Synchrotron Radiation; Nov2011, Vol. 18 Issue 6, p862-870, 9p |
| مصطلحات موضوعية: |
X-ray scattering, SYNCHROTRON radiation sources, MIRROR symmetry, METROLOGY, X-ray spectroscopy |
| مستخلص: |
Characterization and testing of an L-shaped laterally graded multilayer mirror are presented. This mirror is designed as a two-dimensional collimating optics for the analyzer system of the ultra-high-resolution inelastic X-ray scattering (IXS) spectrometer at National Synchrotron Light Source II (NSLS-II). The characterization includes point-to-point reflectivity measurements, lattice parameter determination and mirror metrology (figure, slope error and roughness). The synchrotron X-ray test of the mirror was carried out reversely as a focusing device. The results show that the L-shaped laterally graded multilayer mirror is suitable to be used, with high efficiency, for the analyzer system of the IXS spectrometer at NSLS-II. [ABSTRACT FROM AUTHOR] |
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