التفاصيل البيبلوغرافية
| العنوان: |
Broad-band and X-band ferromagnetic resonance study on Co1.94Fe0.58Ti0.61Si0.88 quaternary Heusler alloy thin film. |
| المؤلفون: |
Rahaman, Mainur, Longchar, Lanuakum A., Pardeep, Basheed, G. A., Raja, M. Manivel, Kaul, S. N., Srinath, S. |
| المصدر: |
AIP Conference Proceedings; 2024, Vol. 2995 Issue 1, p1-4, 4p |
| مصطلحات موضوعية: |
FERROMAGNETIC resonance, CHROMIUM-cobalt-nickel-molybdenum alloys, HEUSLER alloys, THIN films, MAGNETIC anisotropy, MAGNETIC relaxation, MAGNETRON sputtering |
| مستخلص: |
50 nm Co1.94Fe0.58Ti0.61Si0.88 (CFTS) thin film was grown on SiO2/Si (100) substrate by ultra-high vacuum dc magnetron sputtering at 500°C substrate temperature to investigate the magnetization relaxation processes and magnetic anisotropy present in it. Two different ferromagnetic resonance (FMR) techniques have been employed: broad-band (8-40 GHz) FMR at a fixed azimuthal field-angle, and X-band (9.5 GHz) FMR at different polar field angles, in the 'in-plane' (IP) and 'out-of-plane' (OP) sample configurations, respectively. The investigated CFTS film exhibits B2 crystalline order with saturation magnetization, Ms = 783(1) G and the Gilbert damping constant, α = 0.042. [ABSTRACT FROM AUTHOR] |
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| قاعدة البيانات: |
Complementary Index |