التفاصيل البيبلوغرافية
| العنوان: |
Dynamics of polarization loss and imprint in bilayer ferroelectric tunnel junctions. |
| المؤلفون: |
Barbot, J., Fontanini, R., Segatto, M., Coignus, J., Triozon, F., Carabasse, C., Bedjaoui, M., Andrieu, F., Esseni, D., Grenouillet, L. |
| المصدر: |
Journal of Applied Physics; 12/7/2023, Vol. 134 Issue 21, p1-10, 10p |
| مصطلحات موضوعية: |
ALUMINUM oxide, LEAD titanate |
| مستخلص: |
This paper presents polarization loss and imprint in bilayer ferroelectric tunnel junctions as a function of relaxation time (< 1 s) and after different SET/RESET pulses. Measurements were performed on Hf 0.5 Zr 0.5 O 2 /Al 2 O 3 stack at room temperature and systematically compared to reference samples without Al 2 O 3. The experimental results were interpreted using self-consistent simulations coupling the polarization dynamic with charge trapping at the FE/DE interface. From this, mechanisms playing on short-term retention and imprint were explained dynamically. Amount of trapped charge modulated by amplitude and duration of SET/RESET pulses was presented as a root cause. [ABSTRACT FROM AUTHOR] |
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| قاعدة البيانات: |
Complementary Index |