Academic Journal

Evidence of ferromagnetic coupling for manganese pairs in a layered van der Waals GaS semiconductor.

التفاصيل البيبلوغرافية
العنوان: Evidence of ferromagnetic coupling for manganese pairs in a layered van der Waals GaS semiconductor.
المؤلفون: Babunts, Roman A., Batueva, Anastasia V., Gurin, Alexander S., Likhachev, Kirill V., Edinach, Elena V., Baranov, Pavel G.
المصدر: Journal of Applied Physics; 10/28/2023, Vol. 134 Issue 16, p1-7, 7p
مصطلحات موضوعية: HYPERFINE structure, HYPERFINE interactions, ELECTRON paramagnetic resonance, MANGANESE, SEMICONDUCTORS, MAGNETIC fields
مستخلص: Using high-frequency electron paramagnetic resonance (EPR), we have observed the ferromagnetic coupling of manganese Mn2+ pairs in a layered van der Waals GaS semiconductor. The EPR spectra of Mn2+ pairs (Mn24+) [replacing covalently bonded Ga24+ pairs oriented along the chain axis (c axis) of two gallium ions and being situated in the center of the layer] were recorded at 94 and 130 GHz. The fine structure parameters for the lower multiplets with spin S = 5 and S = 4 were determined equal to D = −0.040 cm−1 and D ≅ −0.035 cm−1, respectively. Based on the observation of additional EPR lines in the region of intersection of the levels in the magnetic field of the multiplet with S = 5 and S = 4, the energy of the isotropic exchange interaction J was estimated to be ∼−0.5 cm−1. For all transitions, a well-resolved hyperfine structure was observed, due to the interaction with two equivalent 55Mn nuclei, leading to the appearance of 11 lines with a hyperfine interaction constant A = 30(1) × 10−4 cm−1, which is approximately half the hyperfine interaction constant for single Mn2+ ions. In addition, a signal from single manganese ions Mn2+ with spin S = 5/2 and a hyperfine interaction constant A = 60(1) × 10−4 cm−1 was observed, which are characterized by extremely large fine structure splitting of D = −0.15 cm−1. Simultaneously with EPR studies, the crystals were monitored by photoluminescence and micro-Raman scattering measurements using a microscope with confocal optics. [ABSTRACT FROM AUTHOR]
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قاعدة البيانات: Complementary Index
الوصف
تدمد:00218979
DOI:10.1063/5.0147197