In Situ Atomic Force Microscopy Depth-Corrected Three-Dimensional Focused Ion Beam Based Time-of-Flight Secondary Ion Mass Spectroscopy: Spatial Resolution, Surface Roughness, Oxidation.

التفاصيل البيبلوغرافية
العنوان:	In Situ Atomic Force Microscopy Depth-Corrected Three-Dimensional Focused Ion Beam Based Time-of-Flight Secondary Ion Mass Spectroscopy: Spatial Resolution, Surface Roughness, Oxidation.
المؤلفون:	Pillatsch, Lex, Kalácska, Szilvia, Maeder, Xavier, Michler, Johann
المصدر:	Microscopy & Microanalysis; Feb2021, Vol. 27 Issue 1, p65-73, 9p
قاعدة البيانات:	Complementary Index

الوصف
تدمد:	14319276
DOI:	10.1017/S1431927620024678