Academic Journal
Shockley–Read recombination and trapping in p-type HgCdTe.
| العنوان: | Shockley–Read recombination and trapping in p-type HgCdTe. |
|---|---|
| المؤلفون: | Fastow, R., Goren, D., Nemirovsky, Y. |
| المصدر: | Journal of Applied Physics. 10/1/1990, Vol. 68 Issue 7, p3405. 8p. |
| مصطلحات موضوعية: | *SEMICONDUCTORS, *TRANSIENTS (Dynamics) |
| مستخلص: | Reviews the concepts and definitions of the steady-state minority-carrier lifetime, the steady-state majority-carrier lifetime and the transient excess-carrier lifetime in semiconductors. Discussion on the steady-state lifetime; Transient recombination response and transient lifetimes; Measurements. |
| قاعدة البيانات: | Academic Search Index |
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asx Academic Search Index 7656183 1269 6 Academic Journal academicJournal 1268.93701171875 |
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https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=asx&AN=7656183&custid=s6537998&authtype=sso |
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