التفاصيل البيبلوغرافية
| العنوان: |
Shockley–Read recombination and trapping in p-type HgCdTe. |
| المؤلفون: |
Fastow, R., Goren, D., Nemirovsky, Y. |
| المصدر: |
Journal of Applied Physics. 10/1/1990, Vol. 68 Issue 7, p3405. 8p. |
| مصطلحات موضوعية: |
*SEMICONDUCTORS, *TRANSIENTS (Dynamics) |
| مستخلص: |
Reviews the concepts and definitions of the steady-state minority-carrier lifetime, the steady-state majority-carrier lifetime and the transient excess-carrier lifetime in semiconductors. Discussion on the steady-state lifetime; Transient recombination response and transient lifetimes; Measurements. |
| قاعدة البيانات: |
Academic Search Index |