التفاصيل البيبلوغرافية
| العنوان: |
Dynamics of polarization loss and imprint in bilayer ferroelectric tunnel junctions. |
| المؤلفون: |
Barbot, J.1 (AUTHOR) justine.barbot@cea.fr, Fontanini, R.2 (AUTHOR), Segatto, M.2 (AUTHOR), Coignus, J.1 (AUTHOR), Triozon, F.1 (AUTHOR), Carabasse, C.1 (AUTHOR), Bedjaoui, M.1 (AUTHOR), Andrieu, F.1 (AUTHOR), Esseni, D.2 (AUTHOR), Grenouillet, L.1 (AUTHOR) |
| المصدر: |
Journal of Applied Physics. 12/7/2023, Vol. 134 Issue 21, p1-10. 10p. |
| مصطلحات موضوعية: |
*ALUMINUM oxide, *LEAD titanate |
| مستخلص: |
This paper presents polarization loss and imprint in bilayer ferroelectric tunnel junctions as a function of relaxation time (< 1 s) and after different SET/RESET pulses. Measurements were performed on Hf 0.5 Zr 0.5 O 2 /Al 2 O 3 stack at room temperature and systematically compared to reference samples without Al 2 O 3. The experimental results were interpreted using self-consistent simulations coupling the polarization dynamic with charge trapping at the FE/DE interface. From this, mechanisms playing on short-term retention and imprint were explained dynamically. Amount of trapped charge modulated by amplitude and duration of SET/RESET pulses was presented as a root cause. [ABSTRACT FROM AUTHOR] |
| قاعدة البيانات: |
Academic Search Index |