التفاصيل البيبلوغرافية
| العنوان: |
Beam damage in operando X-ray diffraction studies of Li-ion batteries |
| المؤلفون: |
Kolle Christensen, Christian, Aaskov Karlsen, Martin, Østergaard Drejer, Andreas, Pilgaard Andersen, Bettina, Lund Jakobsen, Christian, Johansen, Morten, Risskov Sørensen, Daniel, Kantor, Innokenty, Ry Vogel Jørgensen, Mads, Ravnsbæk, Dorthe Bomholdt |
| المساهمون: |
Carlsbergfondet, Novo Nordisk Fonden |
| بيانات النشر: |
American Chemical Society (ACS) |
| سنة النشر: |
2022 |
| الوصف: |
Operando powder X-ray diffraction (PXRD) is a widely employed method for investigation of structural evolution and phase transitions in electrodes for rechargeable batteries. Due to the advantages of high brilliance and high X-ray energies, the experiments are often carried out at synchrotron facilities. It is known that the X-ray exposure can cause beam damage in the battery cell resulting in hindrance of the electrochemical reaction. In this study, we investigate the extent of X-ray beam damage during operando powder X-ray diffraction synchrotron experiments of battery materials with varying X-ray energies, amount of X-ray exposure and battery cell chemistries. Battery cells were exposed to 15, 25, or 35 keV X-rays (with varying dose) during charge or discharge in a battery tests cell specially designed for operando experiments. The observed beam damage was probed by µPXRD mapping of the electrodes recovered from the operando battery cell after charge/discharge. Our investigation reveals that beam damage depends strongly both on X-ray energy, amount of exposure and that it depends strongly on the cell chemistry, i.e. the chemical composition of the electrode. |
| نوع الوثيقة: |
other/unknown material |
| اللغة: |
unknown |
| DOI: |
10.26434/chemrxiv-2022-r1f7k |
| الاتاحة: |
http://dx.doi.org/10.26434/chemrxiv-2022-r1f7k
https://chemrxiv.org/engage/api-gateway/chemrxiv/assets/orp/resource/item/634e6139e3f3ee94805e7c5c/original/beam-damage-in-operando-x-ray-diffraction-studies-of-li-ion-batteries.pdf |
| Rights: |
https://creativecommons.org/licenses/by-nc-nd/4.0/ |
| رقم الانضمام: |
edsbas.EC5B850C |
| قاعدة البيانات: |
BASE |