A tool for the automatic analysis of single events effects on electronic circuits
| العنوان: | A tool for the automatic analysis of single events effects on electronic circuits |
|---|---|
| المؤلفون: | Pablo Royer, Javier Agustin, Fernando Garcia-Redondo, Marisa Lopez-Vallejo |
| المصدر: | 5th European Workshop on CMOS Variability (VARI 2014) | 5th European Workshop on CMOS Variability (VARI 2014) | 29/09/2014-01/10/2014 | Palma de Mallorca, Spain Archivo Digital UPM Universidad Politécnica de Madrid |
| بيانات النشر: | E.T.S.I. Telecomunicación (UPM), 2014. |
| سنة النشر: | 2014 |
| مصطلحات موضوعية: | Engineering, Telecomunicaciones, 010308 nuclear & particles physics, business.industry, Circuit design, 020208 electrical & electronic engineering, Mixed-signal integrated circuit, 02 engineering and technology, Hardware_PERFORMANCEANDRELIABILITY, 01 natural sciences, Electronic circuit simulation, Circuit extraction, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Electrónica, Electronics, Physical design, business, IC layout editor, Electronic circuit |
| الوصف: | Nowadays integrated circuit reliability is challenged by both variability and working conditions. Environmental radiation has become a major issue when ensuring the circuit correct behavior. The required radiation and later analysis performed to the circuit boards is both fund and time expensive. The lack of tools which support pre-manufacturing radiation hardness analysis hinders circuit designers tasks. This paper describes an extensively customizable simulation tool for the characterization of radiation effects on electronic systems. The proposed tool can produce an in depth analysis of a complete circuit in almost any kind of radiation environment in affordable computation times. |
| وصف الملف: | application/pdf |
| اللغة: | English |
| URL الوصول: | https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5bf066c62935ea05bfb3a951d4847bbb https://oa.upm.es/36611/ |
| Rights: | OPEN |
| رقم الانضمام: | edsair.doi.dedup.....5bf066c62935ea05bfb3a951d4847bbb |
| قاعدة البيانات: | OpenAIRE |
| ResultId |
1 |
|---|---|
| Header |
edsair OpenAIRE edsair.doi.dedup.....5bf066c62935ea05bfb3a951d4847bbb 775 3 unknown 775.219055175781 |
| PLink |
https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi.dedup.....5bf066c62935ea05bfb3a951d4847bbb&custid=s6537998&authtype=sso |
| FullText |
Array
(
[Availability] => 0
)
Array ( [0] => Array ( [Url] => https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5bf066c62935ea05bfb3a951d4847bbb# [Name] => EDS - OpenAIRE [Category] => fullText [Text] => View record in OpenAIRE [MouseOverText] => View record in OpenAIRE ) ) |
| Items |
Array
(
[Name] => Title
[Label] => Title
[Group] => Ti
[Data] => A tool for the automatic analysis of single events effects on electronic circuits
)
Array ( [Name] => Author [Label] => Authors [Group] => Au [Data] => <searchLink fieldCode="AR" term="%22Pablo+Royer%22">Pablo Royer</searchLink><br /><searchLink fieldCode="AR" term="%22Javier+Agustin%22">Javier Agustin</searchLink><br /><searchLink fieldCode="AR" term="%22Fernando+Garcia-Redondo%22">Fernando Garcia-Redondo</searchLink><br /><searchLink fieldCode="AR" term="%22Marisa+Lopez-Vallejo%22">Marisa Lopez-Vallejo</searchLink> ) Array ( [Name] => TitleSource [Label] => Source [Group] => Src [Data] => 5th European Workshop on CMOS Variability (VARI 2014) | 5th European Workshop on CMOS Variability (VARI 2014) | 29/09/2014-01/10/2014 | Palma de Mallorca, Spain<br />Archivo Digital UPM<br />Universidad Politécnica de Madrid ) Array ( [Name] => Publisher [Label] => Publisher Information [Group] => PubInfo [Data] => E.T.S.I. Telecomunicación (UPM), 2014. ) Array ( [Name] => DatePubCY [Label] => Publication Year [Group] => Date [Data] => 2014 ) Array ( [Name] => Subject [Label] => Subject Terms [Group] => Su [Data] => <searchLink fieldCode="DE" term="%22Engineering%22">Engineering</searchLink><br /><searchLink fieldCode="DE" term="%22Telecomunicaciones%22">Telecomunicaciones</searchLink><br /><searchLink fieldCode="DE" term="%22010308+nuclear+%26+particles+physics%22">010308 nuclear & particles physics</searchLink><br /><searchLink fieldCode="DE" term="%22business%2Eindustry%22">business.industry</searchLink><br /><searchLink fieldCode="DE" term="%22Circuit+design%22">Circuit design</searchLink><br /><searchLink fieldCode="DE" term="%22020208+electrical+%26+electronic+engineering%22">020208 electrical & electronic engineering</searchLink><br /><searchLink fieldCode="DE" term="%22Mixed-signal+integrated+circuit%22">Mixed-signal integrated circuit</searchLink><br /><searchLink fieldCode="DE" term="%2202+engineering+and+technology%22">02 engineering and technology</searchLink><br /><searchLink fieldCode="DE" term="%22Hardware%5FPERFORMANCEANDRELIABILITY%22">Hardware_PERFORMANCEANDRELIABILITY</searchLink><br /><searchLink fieldCode="DE" term="%2201+natural+sciences%22">01 natural sciences</searchLink><br /><searchLink fieldCode="DE" term="%22Electronic+circuit+simulation%22">Electronic circuit simulation</searchLink><br /><searchLink fieldCode="DE" term="%22Circuit+extraction%22">Circuit extraction</searchLink><br /><searchLink fieldCode="DE" term="%220103+physical+sciences%22">0103 physical sciences</searchLink><br /><searchLink fieldCode="DE" term="%220202+electrical+engineering%2C+electronic+engineering%2C+information+engineering%22">0202 electrical engineering, electronic engineering, information engineering</searchLink><br /><searchLink fieldCode="DE" term="%22Electronic+engineering%22">Electronic engineering</searchLink><br /><searchLink fieldCode="DE" term="%22Electrónica%22">Electrónica</searchLink><br /><searchLink fieldCode="DE" term="%22Electronics%22">Electronics</searchLink><br /><searchLink fieldCode="DE" term="%22Physical+design%22">Physical design</searchLink><br /><searchLink fieldCode="DE" term="%22business%22">business</searchLink><br /><searchLink fieldCode="DE" term="%22IC+layout+editor%22">IC layout editor</searchLink><br /><searchLink fieldCode="DE" term="%22Electronic+circuit%22">Electronic circuit</searchLink> ) Array ( [Name] => Abstract [Label] => Description [Group] => Ab [Data] => Nowadays integrated circuit reliability is challenged by both variability and working conditions. Environmental radiation has become a major issue when ensuring the circuit correct behavior. The required radiation and later analysis performed to the circuit boards is both fund and time expensive. The lack of tools which support pre-manufacturing radiation hardness analysis hinders circuit designers tasks. This paper describes an extensively customizable simulation tool for the characterization of radiation effects on electronic systems. The proposed tool can produce an in depth analysis of a complete circuit in almost any kind of radiation environment in affordable computation times. ) Array ( [Name] => Format [Label] => File Description [Group] => SrcInfo [Data] => application/pdf ) Array ( [Name] => Language [Label] => Language [Group] => Lang [Data] => English ) Array ( [Name] => URL [Label] => Access URL [Group] => URL [Data] => <link linkTarget="URL" linkTerm="https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5bf066c62935ea05bfb3a951d4847bbb" linkWindow="_blank">https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5bf066c62935ea05bfb3a951d4847bbb</link><br /><link linkTarget="URL" linkTerm="https://oa.upm.es/36611/" linkWindow="_blank">https://oa.upm.es/36611/</link> ) Array ( [Name] => Copyright [Label] => Rights [Group] => Cpyrght [Data] => OPEN ) Array ( [Name] => AN [Label] => Accession Number [Group] => ID [Data] => edsair.doi.dedup.....5bf066c62935ea05bfb3a951d4847bbb ) |
| RecordInfo |
Array
(
[BibEntity] => Array
(
[Languages] => Array
(
[0] => Array
(
[Text] => English
)
)
[Subjects] => Array
(
[0] => Array
(
[SubjectFull] => Engineering
[Type] => general
)
[1] => Array
(
[SubjectFull] => Telecomunicaciones
[Type] => general
)
[2] => Array
(
[SubjectFull] => 010308 nuclear & particles physics
[Type] => general
)
[3] => Array
(
[SubjectFull] => business.industry
[Type] => general
)
[4] => Array
(
[SubjectFull] => Circuit design
[Type] => general
)
[5] => Array
(
[SubjectFull] => 020208 electrical & electronic engineering
[Type] => general
)
[6] => Array
(
[SubjectFull] => Mixed-signal integrated circuit
[Type] => general
)
[7] => Array
(
[SubjectFull] => 02 engineering and technology
[Type] => general
)
[8] => Array
(
[SubjectFull] => Hardware_PERFORMANCEANDRELIABILITY
[Type] => general
)
[9] => Array
(
[SubjectFull] => 01 natural sciences
[Type] => general
)
[10] => Array
(
[SubjectFull] => Electronic circuit simulation
[Type] => general
)
[11] => Array
(
[SubjectFull] => Circuit extraction
[Type] => general
)
[12] => Array
(
[SubjectFull] => 0103 physical sciences
[Type] => general
)
[13] => Array
(
[SubjectFull] => 0202 electrical engineering, electronic engineering, information engineering
[Type] => general
)
[14] => Array
(
[SubjectFull] => Electronic engineering
[Type] => general
)
[15] => Array
(
[SubjectFull] => Electrónica
[Type] => general
)
[16] => Array
(
[SubjectFull] => Electronics
[Type] => general
)
[17] => Array
(
[SubjectFull] => Physical design
[Type] => general
)
[18] => Array
(
[SubjectFull] => business
[Type] => general
)
[19] => Array
(
[SubjectFull] => IC layout editor
[Type] => general
)
[20] => Array
(
[SubjectFull] => Electronic circuit
[Type] => general
)
)
[Titles] => Array
(
[0] => Array
(
[TitleFull] => A tool for the automatic analysis of single events effects on electronic circuits
[Type] => main
)
)
)
[BibRelationships] => Array
(
[HasContributorRelationships] => Array
(
[0] => Array
(
[PersonEntity] => Array
(
[Name] => Array
(
[NameFull] => Pablo Royer
)
)
)
[1] => Array
(
[PersonEntity] => Array
(
[Name] => Array
(
[NameFull] => Javier Agustin
)
)
)
[2] => Array
(
[PersonEntity] => Array
(
[Name] => Array
(
[NameFull] => Fernando Garcia-Redondo
)
)
)
[3] => Array
(
[PersonEntity] => Array
(
[Name] => Array
(
[NameFull] => Marisa Lopez-Vallejo
)
)
)
)
[IsPartOfRelationships] => Array
(
[0] => Array
(
[BibEntity] => Array
(
[Dates] => Array
(
[0] => Array
(
[D] => 01
[M] => 01
[Type] => published
[Y] => 2014
)
)
[Identifiers] => Array
(
[0] => Array
(
[Type] => issn-locals
[Value] => edsair
)
[1] => Array
(
[Type] => issn-locals
[Value] => edsairFT
)
)
)
)
)
)
)
|
| IllustrationInfo |