Inelastic X-ray Scattering Measurement on SiGeSn Polycrystalline Alloy
| العنوان: | Inelastic X-ray Scattering Measurement on SiGeSn Polycrystalline Alloy |
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| المؤلفون: | Yosuke Shimura, Kako Iwamoto, Ryo Yokogawa, Motohiro Tomita, Hirokazu Tatsuoka, Hiroshi Uchiyama, Atsushi Ogura |
| المصدر: | Extended Abstracts of the 2020 International Conference on Solid State Devices and Materials. |
| بيانات النشر: | The Japan Society of Applied Physics, 2020. |
| سنة النشر: | 2020 |
| DOI: | 10.7567/ssdm.2020.f-2-06 |
| URL الوصول: | https://explore.openaire.eu/search/publication?articleId=doi_________::83315a164624fec01a55feeea6f9f187 https://doi.org/10.7567/ssdm.2020.f-2-06 |
| رقم الانضمام: | edsair.doi...........83315a164624fec01a55feeea6f9f187 |
| قاعدة البيانات: | OpenAIRE |
| DOI: | 10.7567/ssdm.2020.f-2-06 |
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