Experimental evidence of nanometer-scale localized recombination due to random In fluctuations in InGaN/GaN quantum wells (Conference Presentation)

التفاصيل البيبلوغرافية
العنوان: Experimental evidence of nanometer-scale localized recombination due to random In fluctuations in InGaN/GaN quantum wells (Conference Presentation)
المؤلفون: Fouad Maroun, Nathan G. Young, Petr Polovodov, Wiebke Hahn, Jacques Peretti, Jean-Marie Lentali, Y. Lassailly, James S. Speck, Claude Weisbuch, Lucio Martinelli, Marcel Filoche
المصدر: Physics and Simulation of Optoelectronic Devices XXVI.
بيانات النشر: SPIE, 2018.
سنة النشر: 2018
مصطلحات موضوعية: Condensed Matter::Materials Science, Materials science, Band bending, Condensed matter physics, Tunnel junction, law, Biasing, Heterojunction, Scanning tunneling microscope, Electronic band structure, Luminescence, Quantum well, law.invention
الوصف: In nitride ternary alloys, natural compositional disorder induces strong electronic localization effects. We present a new experimental approach which allows a direct probing at nanometer scale of disorder-induced localization effects in InGaN/GaN quantum wells (QWs). In this experiment, samples are p-type heterostructures incorporating an InGaN/GaN QW nearby the surface. The electrons are locally injected from a scanning tunneling microscope (STM) tip into the conduction band of the thin cladding top GaN layer and captured in the InGaN QW where they radiatively recombine. The injected current is maintained constant by the STM feedback loop and the injection electron energy is controlled by the bias voltage applied to the tip-sample tunnel junction. The luminescence onset voltage coincides with electron injection above the bottom of the conduction band in the bulk GaN (beyond the band bending region). Thereby, scanning the tip allows the high-resolution mapping of the luminescence process in the InGaN QW. Spatial fluctuations of the luminescence peak energy and linewidth are observed on the scale of a few nanometers, which are characteristic of disorder-induced carrier localization. A model based on the so-called localization landscape theory is developed to take into account the effect of alloy disorder into simulations of the structure properties. The localization landscape notably describes an effective confining potential, whose basins and crests define the localization regions of carriers. This theory accounts well for the observed nanometer scale carrier localization and the energy-dependent luminescence linewidth observed for the quantum electron states in the disordered energy band.
DOI: 10.1117/12.2290887
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0bd515f117ac0fb69ffba1fce19a10d1
https://doi.org/10.1117/12.2290887
رقم الانضمام: edsair.doi...........0bd515f117ac0fb69ffba1fce19a10d1
قاعدة البيانات: OpenAIRE
ResultId 1
Header edsair
OpenAIRE
edsair.doi...........0bd515f117ac0fb69ffba1fce19a10d1
818
3

unknown
818.362670898438
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi...........0bd515f117ac0fb69ffba1fce19a10d1&custid=s6537998&authtype=sso
FullText Array ( [Availability] => 0 )
Array ( [0] => Array ( [Url] => https://explore.openaire.eu/search/publication?articleId=doi_________::0bd515f117ac0fb69ffba1fce19a10d1# [Name] => EDS - OpenAIRE [Category] => fullText [Text] => View record in OpenAIRE [MouseOverText] => View record in OpenAIRE ) )
Items Array ( [Name] => Title [Label] => Title [Group] => Ti [Data] => Experimental evidence of nanometer-scale localized recombination due to random In fluctuations in InGaN/GaN quantum wells (Conference Presentation) )
Array ( [Name] => Author [Label] => Authors [Group] => Au [Data] => <searchLink fieldCode="AR" term="%22Fouad+Maroun%22">Fouad Maroun</searchLink><br /><searchLink fieldCode="AR" term="%22Nathan+G%2E+Young%22">Nathan G. Young</searchLink><br /><searchLink fieldCode="AR" term="%22Petr+Polovodov%22">Petr Polovodov</searchLink><br /><searchLink fieldCode="AR" term="%22Wiebke+Hahn%22">Wiebke Hahn</searchLink><br /><searchLink fieldCode="AR" term="%22Jacques+Peretti%22">Jacques Peretti</searchLink><br /><searchLink fieldCode="AR" term="%22Jean-Marie+Lentali%22">Jean-Marie Lentali</searchLink><br /><searchLink fieldCode="AR" term="%22Y%2E+Lassailly%22">Y. Lassailly</searchLink><br /><searchLink fieldCode="AR" term="%22James+S%2E+Speck%22">James S. Speck</searchLink><br /><searchLink fieldCode="AR" term="%22Claude+Weisbuch%22">Claude Weisbuch</searchLink><br /><searchLink fieldCode="AR" term="%22Lucio+Martinelli%22">Lucio Martinelli</searchLink><br /><searchLink fieldCode="AR" term="%22Marcel+Filoche%22">Marcel Filoche</searchLink> )
Array ( [Name] => TitleSource [Label] => Source [Group] => Src [Data] => <i>Physics and Simulation of Optoelectronic Devices XXVI</i>. )
Array ( [Name] => Publisher [Label] => Publisher Information [Group] => PubInfo [Data] => SPIE, 2018. )
Array ( [Name] => DatePubCY [Label] => Publication Year [Group] => Date [Data] => 2018 )
Array ( [Name] => Subject [Label] => Subject Terms [Group] => Su [Data] => <searchLink fieldCode="DE" term="%22Condensed+Matter%3A%3AMaterials+Science%22">Condensed Matter::Materials Science</searchLink><br /><searchLink fieldCode="DE" term="%22Materials+science%22">Materials science</searchLink><br /><searchLink fieldCode="DE" term="%22Band+bending%22">Band bending</searchLink><br /><searchLink fieldCode="DE" term="%22Condensed+matter+physics%22">Condensed matter physics</searchLink><br /><searchLink fieldCode="DE" term="%22Tunnel+junction%22">Tunnel junction</searchLink><br /><searchLink fieldCode="DE" term="%22law%22">law</searchLink><br /><searchLink fieldCode="DE" term="%22Biasing%22">Biasing</searchLink><br /><searchLink fieldCode="DE" term="%22Heterojunction%22">Heterojunction</searchLink><br /><searchLink fieldCode="DE" term="%22Scanning+tunneling+microscope%22">Scanning tunneling microscope</searchLink><br /><searchLink fieldCode="DE" term="%22Electronic+band+structure%22">Electronic band structure</searchLink><br /><searchLink fieldCode="DE" term="%22Luminescence%22">Luminescence</searchLink><br /><searchLink fieldCode="DE" term="%22Quantum+well%22">Quantum well</searchLink><br /><searchLink fieldCode="DE" term="%22law%2Einvention%22">law.invention</searchLink> )
Array ( [Name] => Abstract [Label] => Description [Group] => Ab [Data] => In nitride ternary alloys, natural compositional disorder induces strong electronic localization effects. We present a new experimental approach which allows a direct probing at nanometer scale of disorder-induced localization effects in InGaN/GaN quantum wells (QWs). In this experiment, samples are p-type heterostructures incorporating an InGaN/GaN QW nearby the surface. The electrons are locally injected from a scanning tunneling microscope (STM) tip into the conduction band of the thin cladding top GaN layer and captured in the InGaN QW where they radiatively recombine. The injected current is maintained constant by the STM feedback loop and the injection electron energy is controlled by the bias voltage applied to the tip-sample tunnel junction. The luminescence onset voltage coincides with electron injection above the bottom of the conduction band in the bulk GaN (beyond the band bending region). Thereby, scanning the tip allows the high-resolution mapping of the luminescence process in the InGaN QW. Spatial fluctuations of the luminescence peak energy and linewidth are observed on the scale of a few nanometers, which are characteristic of disorder-induced carrier localization. A model based on the so-called localization landscape theory is developed to take into account the effect of alloy disorder into simulations of the structure properties. The localization landscape notably describes an effective confining potential, whose basins and crests define the localization regions of carriers. This theory accounts well for the observed nanometer scale carrier localization and the energy-dependent luminescence linewidth observed for the quantum electron states in the disordered energy band. )
Array ( [Name] => DOI [Label] => DOI [Group] => ID [Data] => 10.1117/12.2290887 )
Array ( [Name] => URL [Label] => Access URL [Group] => URL [Data] => <link linkTarget="URL" linkTerm="https://explore.openaire.eu/search/publication?articleId=doi_________::0bd515f117ac0fb69ffba1fce19a10d1" linkWindow="_blank">https://explore.openaire.eu/search/publication?articleId=doi_________::0bd515f117ac0fb69ffba1fce19a10d1</link><br /><link linkTarget="URL" linkTerm="https://doi.org/10.1117/12.2290887" linkWindow="_blank">https://doi.org/10.1117/12.2290887</link> )
Array ( [Name] => AN [Label] => Accession Number [Group] => ID [Data] => edsair.doi...........0bd515f117ac0fb69ffba1fce19a10d1 )
RecordInfo Array ( [BibEntity] => Array ( [Identifiers] => Array ( [0] => Array ( [Type] => doi [Value] => 10.1117/12.2290887 ) ) [Languages] => Array ( [0] => Array ( [Text] => Undetermined ) ) [Subjects] => Array ( [0] => Array ( [SubjectFull] => Condensed Matter::Materials Science [Type] => general ) [1] => Array ( [SubjectFull] => Materials science [Type] => general ) [2] => Array ( [SubjectFull] => Band bending [Type] => general ) [3] => Array ( [SubjectFull] => Condensed matter physics [Type] => general ) [4] => Array ( [SubjectFull] => Tunnel junction [Type] => general ) [5] => Array ( [SubjectFull] => law [Type] => general ) [6] => Array ( [SubjectFull] => Biasing [Type] => general ) [7] => Array ( [SubjectFull] => Heterojunction [Type] => general ) [8] => Array ( [SubjectFull] => Scanning tunneling microscope [Type] => general ) [9] => Array ( [SubjectFull] => Electronic band structure [Type] => general ) [10] => Array ( [SubjectFull] => Luminescence [Type] => general ) [11] => Array ( [SubjectFull] => Quantum well [Type] => general ) [12] => Array ( [SubjectFull] => law.invention [Type] => general ) ) [Titles] => Array ( [0] => Array ( [TitleFull] => Experimental evidence of nanometer-scale localized recombination due to random In fluctuations in InGaN/GaN quantum wells (Conference Presentation) [Type] => main ) ) ) [BibRelationships] => Array ( [HasContributorRelationships] => Array ( [0] => Array ( [PersonEntity] => Array ( [Name] => Array ( [NameFull] => Fouad Maroun ) ) ) [1] => Array ( [PersonEntity] => Array ( [Name] => Array ( [NameFull] => Nathan G. Young ) ) ) [2] => Array ( [PersonEntity] => Array ( [Name] => Array ( [NameFull] => Petr Polovodov ) ) ) [3] => Array ( [PersonEntity] => Array ( [Name] => Array ( [NameFull] => Wiebke Hahn ) ) ) [4] => Array ( [PersonEntity] => Array ( [Name] => Array ( [NameFull] => Jacques Peretti ) ) ) [5] => Array ( [PersonEntity] => Array ( [Name] => Array ( [NameFull] => Jean-Marie Lentali ) ) ) [6] => Array ( [PersonEntity] => Array ( [Name] => Array ( [NameFull] => Y. Lassailly ) ) ) [7] => Array ( [PersonEntity] => Array ( [Name] => Array ( [NameFull] => James S. Speck ) ) ) [8] => Array ( [PersonEntity] => Array ( [Name] => Array ( [NameFull] => Claude Weisbuch ) ) ) [9] => Array ( [PersonEntity] => Array ( [Name] => Array ( [NameFull] => Lucio Martinelli ) ) ) [10] => Array ( [PersonEntity] => Array ( [Name] => Array ( [NameFull] => Marcel Filoche ) ) ) ) [IsPartOfRelationships] => Array ( [0] => Array ( [BibEntity] => Array ( [Dates] => Array ( [0] => Array ( [D] => 14 [M] => 03 [Type] => published [Y] => 2018 ) ) [Identifiers] => Array ( [0] => Array ( [Type] => issn-locals [Value] => edsair ) ) [Titles] => Array ( [0] => Array ( [TitleFull] => Physics and Simulation of Optoelectronic Devices XXVI [Type] => main ) ) ) ) ) ) )
IllustrationInfo