Periodical
Dynamics of electromigration induced void/hillock growth and precipitation/dissolution of addition elements studied by in-situ scanning electron microscopy resistance measurements
| العنوان: | Dynamics of electromigration induced void/hillock growth and precipitation/dissolution of addition elements studied by in-situ scanning electron microscopy resistance measurements |
|---|---|
| المؤلفون: | D'Haen, J., Cosemans, P., Manca, J.V., Lekens, G., Martens, T., Ceuninck, W. De, D'Olieslaeger, M., Schepper, L. De, Maex, K. |
| المصدر: | Microelectronics Reliability; 1999, Vol. 39 Issue: 11 p1617-1630, 14p |
| قاعدة البيانات: | Supplemental Index |
| تدمد: | 00262714 |
|---|---|
| DOI: | 10.1016/S0026-2714(99)00169-9 |