المؤلفون: Jong-Uk Kim, Do-Yeon Park, Byeong-Jun Park, Sung-Ho Hahm

المصدر: Technologies, Vol 12, Iss 12, p 262 (2024)

مصطلحات موضوعية: superjunction, current aperture vertical electron transistor (CAVET), vertical HEMTs, breakdown voltage (BV), reverse transfer capacitance (Crss), Technology

وصف الملف: electronic resource

Relation: https://www.mdpi.com/2227-7080/12/12/262; https://doaj.org/toc/2227-7080

URL الوصول: https://doaj.org/article/f6e0fdeb211041bbb41ee48f7f718b63