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1Conference
المساهمون: Wang, YG (reprint author), Peking Univ, Inst Microelect, Beijing 100871, Peoples R China., Peking Univ, Inst Microelect, Beijing 100871, Peoples R China.
المصدر: SCI
مصطلحات موضوعية: substrate current, soft breakdown, ultra-thin gate oxide, Weibull distribution, variable frequency light pumping, LAYERS
Relation: 2004: 7TH INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUITS TECHNOLOGY, VOLS 1- 3, PROCEEDINGS.; 1061526; http://hdl.handle.net/20.500.11897/293748; WOS:000227342201013