المؤلفون: Jansa, Zdeněk, Prušáková, Lucie, Alarab, Fatima, Šutta, Pavol, Minár, Jan

مصطلحات موضوعية: Perovskit, rentgenová difrakce, tenké vrstvy, strukturní analýza, XRD diffraction, thin layers, tructural analysis

وصف الملف: 5 s.; application/pdf

Relation: JANSA, Z., PRUŠÁKOVÁ, L., ALARAB, F., ŠUTTA, P., MINÁR, J. Structural analysis of Ni-doped SrTiO3: XRD study. In: APCOM 2019 � Applied physics of condensed matter. Bratislava: American Institute of Physics Inc., 2019. ISBN 978-0-7354-1873-8 , ISSN 0094-243X.; 2-s2.0-85070536071; http://hdl.handle.net/11025/36459

الاتاحة: http://hdl.handle.net/11025/36459
https://doi.org/10.1063/1.5119475

المؤلفون: Jansa, Zdeněk, Prušáková, Lucie, Alarab, Fatima, Šutta, Pavol, Minár, Jan

مصطلحات موضوعية: strukturní analýza, thin layers, XRD diffraction, tenké vrstvy, tructural analysis, rentgenová difrakce, Perovskit

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=od______8936::ce14f8eeecc7e3cafb011862d9a61344
http://hdl.handle.net/11025/36459