المؤلفون: Yonghui Dong (284978), Nir Shachaf (645813), Liron Feldberg (2337841), Ilana Rogachev (157329), Uwe Heinig (5637458), Asaph Aharoni (157344)

مصطلحات موضوعية: Biochemistry, Cell Biology, Plant Biology, Space Science, Environmental Sciences not elsewhere classified, Biological Sciences not elsewhere classified, Chemical Sciences not elsewhere classified, total computation time, propose three strategies, naturally occurring phenomenon, assisted laser desorption, moderately colocalized ions, group ions stemming, mass spectrometry imaging, given precursor ion, precursor ion results, ms spectra ”, precursor ion identification, approach termed pica, confidence metabolite identification, precursor ion, metabolite identification, adduct ions, maldi imaging, increase confidence, efficient approach, “ pseudo, takes advantage, structurally related, source fragments

Relation: https://figshare.com/articles/journal_contribution/PICA_Pixel_Intensity_Correlation_Analysis_for_Deconvolution_and_Metabolite_Identification_in_Mass_Spectrometry_Imaging/21805920

الاتاحة: https://doi.org/10.1021/acs.analchem.2c04778.s001

المؤلفون: Yamato, Yuta, Yoneda, Tomokazu, Hatayama, Kazumi, Inoue, Michiko

مصطلحات موضوعية: automatic test pattern generation, benchmark testing, infrared spectra, nanoelectronics, IR-drop-induced yield loss, at-speed scan test pattern validation, benchmark circuits, global cycle average power profile, nano-scale designs, per-cell dynamic IR-drop estimation method, representative patterns, supply voltage, total computation time, Clocks, Delay, Estimation, Power demand, Switches

وصف الملف: application/pdf

Relation: http://ieeexplore.ieee.org/document/6401549/; http://hdl.handle.net/10061/11174

الاتاحة: http://hdl.handle.net/10061/11174

المؤلفون: Michiko Inoue, Tomokazu Yoneda, Kazumi Hatayama, Yuta Yamato

المصدر: ITC

مصطلحات موضوعية: Engineering, benchmark testing, Computation, infrared spectra, representative patterns, Automatic test pattern generation, nanoelectronics, automatic test pattern generation, total computation time, at-speed scan test pattern validation, per-cell dynamic IR-drop estimation method, Power network design, Simulation, Clocks, Electronic circuit, Vulnerability (computing), Delay, global cycle average power profile, business.industry, benchmark circuits, Power (physics), supply voltage, nano-scale designs, IR-drop-induced yield loss, Benchmark (computing), Power demand, business, Estimation, Switches, Algorithm, Voltage

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::de11bbc52cd15bbec2d9e040790651ba
https://doi.org/10.1109/test.2012.6401549

المؤلفون: Yamato, Yuta, Yoneda, Tomokazu, Hatayama, Kazumi, Inoue, Michiko

مصطلحات الفهرس: automatic test pattern generation, benchmark testing, infrared spectra, nanoelectronics, IR-drop-induced yield loss, at-speed scan test pattern validation, benchmark circuits, global cycle average power profile, nano-scale designs, per-cell dynamic IR-drop estimation method, representative patterns, supply voltage, total computation time, Clocks, Delay, Estimation, Power demand, Switches, Conference Paper, AM

URL: http://hdl.handle.net/10061/11174
https://naist.repo.nii.ac.jp/?action=repository_action_common_download&item_id=4905&item_no=1&attribute_id=17&file_no=1
https://doi.org/10.1109/TEST.2012.6401549
http://ieeexplore.ieee.org/document/6401549/
https://doi.org/10.1109/TEST.2012.6401549
http://ieeexplore.ieee.org/document/6401549

المؤلفون: 20707244, Yamato, Yuta, Yoneda, Tomokazu, Hatayama, Kazumi, 30273840, Inoue, Michiko

مصطلحات الفهرس: automatic test pattern generation, benchmark testing, infrared spectra, nanoelectronics, IR-drop-induced yield loss, at-speed scan test pattern validation, benchmark circuits, global cycle average power profile, nano-scale designs, per-cell dynamic IR-drop estimation method, representative patterns, supply voltage, total computation time, Clocks, Delay, Estimation, Power demand, Switches, Conference Paper, AM

URL: http://hdl.handle.net/10061/11174
https://naist.repo.nii.ac.jp/records/4905
https://naist.repo.nii.ac.jp/record/4905/files/125_S6_2_248202615.pdf
https://doi.org/10.1109/TEST.2012.6401549
http://ieeexplore.ieee.org/document/6401549/
https://doi.org/10.1109/TEST.2012.6401549
http://ieeexplore.ieee.org/document/6401549