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1Academic Journal
المؤلفون: Jonas Weber, Yue Yuan, Sebastian Pazos, Fabian Kühnel, Christoph Metzke, Josef Schätz, Werner Frammelsberger, Günther Benstetter, Mario Lanza
مصطلحات موضوعية: Biophysics, Biotechnology, Chemical Sciences not elsewhere classified, ultrasharp conductive nanoprobe, reference ultrathin dielectric, randomly selected locations, important characterization techniques, high lateral resolution, almost always results, fast nanoprobe degradation, tunneling current across, current limitation system, tip degradation, ∼ 50, work contributes, technique scans, sought solution, significantly enhance, preferred tool, many companies, inexpensive long, data sets, data collected, contact area, also endangers
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2Academic Journal
المؤلفون: Jiang, Lanlan, Weber, Jonas, Puglisi, Francesco Maria, Pavan, Paolo, Larcher, Luca, Frammelsberger, Werner, Benstetter, Guenther, Lanza, Mario
المساهمون: Jiang, Lanlan, Weber, Jona, Puglisi, Francesco Maria, Pavan, Paolo, Larcher, Luca, Frammelsberger, Werner, Benstetter, Guenther, Lanza, Mario
مصطلحات موضوعية: CAFM, Modeling, Tip degradation, Tunneling current, Water meniscu, Materials Science (all)
Relation: info:eu-repo/semantics/altIdentifier/pmid/30717254; info:eu-repo/semantics/altIdentifier/wos/WOS:000460768000128; volume:12; issue:3; firstpage:1; lastpage:10; numberofpages:10; journal:MATERIALS; http://hdl.handle.net/11380/1175103; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85061012198; https://www.mdpi.com/1996-1944/12/3/459/pdf
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3
المؤلفون: Guenther Benstetter, Jonas Weber, Paolo Pavan, Luca Larcher, Francesco Maria Puglisi, Werner Frammelsberger, Lanlan Jiang, Mario Lanza
المصدر: Materials, Vol 12, Iss 3, p 459 (2019)
Materials; Volume 12; Issue 3; Pages: 459
Materialsمصطلحات موضوعية: water meniscus, Tip degradation, Materials science, CAFM, Modeling, Tunneling current, Water meniscus, Materials Science (all), Conductivity, lcsh:Technology, Article, tip degradation, tunneling current, modeling, Contact force, General Materials Science, lcsh:Microscopy, Nanoscopic scale, Stable state, lcsh:QC120-168.85, lcsh:QH201-278.5, business.industry, lcsh:T, Conductive atomic force microscopy, Characterization (materials science), lcsh:TA1-2040, Optoelectronics, lcsh:Descriptive and experimental mechanics, lcsh:Electrical engineering. Electronics. Nuclear engineering, Current (fluid), business, lcsh:Engineering (General). Civil engineering (General), lcsh:TK1-9971
وصف الملف: application/pdf