المؤلفون: Tiancheng Wu, Weikang Fan, Yuefeng Gu, Feifan Fan, Qiuhong Li

المصدر: IEEE Access, Vol 12, Pp 109218-109229 (2024)

مصطلحات موضوعية: Design for testability, fault simulator, march algorithm, memory testing, three-cell coupling fault, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/10623655/; https://doaj.org/toc/2169-3536

URL الوصول: https://doaj.org/article/1971d49db973401aa1c4509fef23aa51