المؤلفون: Lupeng Chen, Jian Liu, Zhongmei Pan, Zhihua Zhang

المصدر: Frontiers in Energy Research, Vol 11 (2023)

مصطلحات موضوعية: distribution lines, parameter estimation, testability analysis, measurement data, elitist searching approach, General Works

وصف الملف: electronic resource

Relation: https://www.frontiersin.org/articles/10.3389/fenrg.2023.1249782/full; https://doaj.org/toc/2296-598X

URL الوصول: https://doaj.org/article/929706438ca949889bea958ad74c55b2

المؤلفون: Marco Bindi, Maria Cristina Piccirilli, Antonio Luchetta, Francesco Grasso, Stefano Manetti

المصدر: Electronics; Volume 11; Issue 10; Pages: 1589

مصطلحات موضوعية: DC–DC power converters, pulse-width modulation converters, switched-mode power supply, testability analysis, analog circuit fault diagnosis, neural networks

وصف الملف: application/pdf

Relation: Circuit and Signal Processing; https://dx.doi.org/10.3390/electronics11101589

الاتاحة: https://doi.org/10.3390/electronics11101589

المؤلفون: Igor Aizenberg, Riccardo Belardi, Marco Bindi, Francesco Grasso, Stefano Manetti, Antonio Luchetta, Maria Cristina Piccirilli

المصدر: Electronics; Volume 10; Issue 3; Pages: 349

مصطلحات موضوعية: fault diagnosis, complex neural network, frequency response analysis, testability analysis, symbolic CAD, analog circuits

وصف الملف: application/pdf

Relation: Circuit and Signal Processing; https://dx.doi.org/10.3390/electronics10030349

الاتاحة: https://doi.org/10.3390/electronics10030349

المؤلفون: Francesco Grasso, Riccardo Belardi, Marco Bindi, Stefano Manetti, Maria Cristina Piccirilli, Igor Aizenberg, Antonio Luchetta

المصدر: Advances in Science, Technology and Engineering Systems Journal. 5:488-498

مصطلحات موضوعية: Physics and Astronomy (miscellaneous), Artificial neural network, Computer science, High-Voltage transmission line, Complex neural network, Smart monitoring, Fault diagnosis, Electrical joint modeling, Testability analysis, Management of Technology and Innovation, Electronic engineering, High voltage, Fault (power engineering), Engineering (miscellaneous), ComputingMilieux_MISCELLANEOUS

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9afb9084057809b135c196c6d301899d
https://doi.org/10.25046/aj050458

المؤلفون: Durba Chatterjee, Debdeep Mukhopadhyay, Aritra Hazra

المصدر: VLSI-SoC

مصطلحات موضوعية: Scheme (programming language), ComputingMilieux_MANAGEMENTOFCOMPUTINGANDINFORMATIONSYSTEMS, Theoretical computer science, Bent function, Testability analysis, Learnability, Computer science, Reliability (computer networking), Leverage (statistics), CAD, Boolean function, computer, computer.programming_language

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a07b2d552cc36d5de7fef7d51e5ef199
https://doi.org/10.1109/vlsi-soc53125.2021.9607011

المؤلفون: Do, H, V, Robach, C, Delaunay, M, Cruz, J.-S

المساهمون: Laboratoire de Conception et d'Intégration des Systèmes (LCIS), Université Pierre Mendès France - Grenoble 2 (UPMF)-Institut National Polytechnique de Grenoble (INPG), Laboratoire Logiciels Systèmes Réseaux (LSR - IMAG), Université Joseph Fourier - Grenoble 1 (UJF)-Institut National Polytechnique de Grenoble (INPG)-Centre National de la Recherche Scientifique (CNRS), MBDA France Le Plessis Robinson

المصدر: ERTS 2006 proceedings ; Conference ERTS'06 ; https://hal.science/hal-02270467 ; Conference ERTS'06, Jan 2006, Toulouse, France

مصطلحات موضوعية: Reactive Real-Time system, Data-Flow design, Testability Analysis, [INFO]Computer Science [cs], [INFO.INFO-ES]Computer Science [cs]/Embedded Systems

جغرافية الموضوع: Toulouse, France

Relation: hal-02270467; https://hal.science/hal-02270467; https://hal.science/hal-02270467/document; https://hal.science/hal-02270467/file/7B1_HV.Do_LCIS.pdf

الاتاحة: https://hal.science/hal-02270467
https://hal.science/hal-02270467/document
https://hal.science/hal-02270467/file/7B1_HV.Do_LCIS.pdf

المؤلفون: Gongwang Qiu, Yu Cai, Haihua Wu, Dianjun Lv

المصدر: 2021 IEEE Asia-Pacific Conference on Image Processing, Electronics and Computers (IPEC).

مصطلحات موضوعية: Model method, Testability analysis, Filter (video), Computer science, Amplifier, Hierarchical control system, Algorithm, Testability, Fault detection and isolation, Signal-flow graph

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::cbdb493f6595557e0ba0ff6f73e390d6
https://doi.org/10.1109/ipec51340.2021.9421259

المؤلفون: Marco Bindi, Francesco Grasso, Antonio Luchetta, Maria Cristina Piccirilli, Riccardo Belardi, Igor Aizenberg, Stefano Manetti

المصدر: Electronics, Vol 10, Iss 349, p 349 (2021)
Electronics
Volume 10
Issue 3

مصطلحات موضوعية: analog circuits, Analogue electronics, symbolic CAD, Computer Networks and Communications, Computer science, lcsh:Electronics, Value (computer science), lcsh:TK7800-8360, complex neural network, Hardware_PERFORMANCEANDRELIABILITY, fault diagnosis, Fault (power engineering), testability analysis, Hardware and Architecture, Control and Systems Engineering, Component (UML), Signal Processing, frequency response analysis, Electrical and Electronic Engineering, Algorithm, Testability, Parametric statistics, Hardware_LOGICDESIGN

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c8fd9ba08accd20045be14d508fb3c51
https://www.mdpi.com/2079-9292/10/3/349

المؤلفون: Jing Dai, Limei Tian, Diyin Tang, Wu Yao, Zhanbao Gao, Jinsong Yu

المصدر: 2020 15th IEEE Conference on Industrial Electronics and Applications (ICIEA).

مصطلحات موضوعية: Testability analysis, Liquid-propellant rocket, Computer science, Component (UML), GeneralLiterature_MISCELLANEOUS, Testability, Fault detection and isolation, Reliability engineering, Signal-flow graph

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ded9c00d37ffca819df2b8ee8c3213e8
https://doi.org/10.1109/iciea48937.2020.9248150

المؤلفون: Mahmoud Efatmaneshnik, Shraga Shoval, Michael J. Ryan

المصدر: INSIGHT. 21:72-79

مصطلحات موضوعية: Testability analysis, Computer science, business.industry, 0103 physical sciences, Perspective (graphical), 0202 electrical engineering, electronic engineering, information engineering, Systems architecture, 020207 software engineering, 02 engineering and technology, Software engineering, business, 010301 acoustics, 01 natural sciences

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e72525d0d7a11e605a5e885dc2213678
https://doi.org/10.1002/inst.12214

المؤلفون: Felderer, Michael, 1978, Marculescu, Bogdan, Gomes De Oliveira Neto, Francisco, Feldt, Robert, Torkar, Richard

المصدر: 2018 IEEE 11TH INTERNATIONAL CONFERENCE ON SOFTWARE TESTING, VERIFICATION AND VALIDATION WORKSHOPS (ICSTW). :54-58

مصطلحات موضوعية: Extra-Functional Properties, Non-Functional Properties, Robustness, Software Testing, Testability, Robustness (control systems), Verification, Non functional properties, Testability Analysis

وصف الملف: print

URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:bth-16928

المؤلفون: Jian Qin, Xiaoshuai Du, Bing Hu

المصدر: Journal of Physics: Conference Series. 2093:012031

مصطلحات موضوعية: History, Dependency (UML), Testability analysis, Computer science, law, Radar, Computer Science Applications, Education, law.invention, Reliability engineering

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f37246d98069628c82d5e89cd42edcd0
https://doi.org/10.1088/1742-6596/2093/1/012031

المؤلفون: Zuhoor Al-khanjari

المساهمون: The Pennsylvania State University CiteSeerX Archives

مصطلحات موضوعية: Testability analysis, PIE technique, mutation testing, mutant schemata approach, Mothra mutation system, PiSCES, MSG-Infection tool

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.167.1581

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.167.1581

المؤلفون: Naresh Chandra Agrawal

المصدر: International Journal for Research in Applied Science and Engineering Technology. :43-49

مصطلحات موضوعية: Very-large-scale integration, CMOS, Computer architecture, Testability analysis, Computer science, Domino

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c2c876d84392a7900d8a921277bfb760
https://doi.org/10.22214/ijraset.2017.9010

المؤلفون: Sreeja Rajendran, Mary Lourde Regeena

المصدر: International journal of simulation: systems, science & technology.

مصطلحات موضوعية: Combinational logic, Testability analysis, business.industry, Computer science, Modeling and Simulation, Embedded system, Software tool, business, Software

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2953ac242f1a43548edccc4b660b7113
https://doi.org/10.5013/ijssst.a.20.02.04

المؤلفون: Stefano Manetti, Maria Cristina Piccirilli, Marco Bindi, Francesco Grasso, Antonio Luchetta, Igor Aizenberg

المصدر: RTSI

مصطلحات موضوعية: Artificial neural network, Testability analysis, Switched-mode power supply, Computer science, Electronic engineering, Hardware_PERFORMANCEANDRELIABILITY, Converters, Fault (power engineering), Symbolic data analysis, Dc dc converter, Electronic circuit

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c2dd395c3aef6ea871df4490086ca6c2
https://doi.org/10.1109/rtsi.2019.8895583

المؤلفون: Peter Bukovjan Laurent, Laurent Ducerf-bourbon, Meryem Marzouki

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: ftp://asim.lip6.fr/pub/reports/2000/ar.buk.latw00.ps.gz

مصطلحات موضوعية: BIST, synthesis for testability, DFT reuse, testability analysis

وصف الملف: application/postscript

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.11.1693

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.11.1693

المؤلفون: Peter Bukovjan Meryem, Peter Bukovjan, Meryem Marzouki, Walid Maroufi

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: ftp://asim.lip6.fr/pub/reports/1999/ar.buk.ewdc99.ps.gz

مصطلحات موضوعية: testability analysis, high-level synthesis for testability

وصف الملف: application/postscript

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.4.9526

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.4.9526

المؤلفون: Peter Bukovjan, Meryem Marzouki, Walid Maroufi

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: ftp://asim.lip6.fr/pub/reports/1999/ar.buk.etw99.ps.gz

مصطلحات موضوعية: synthesis for testability, DFT reuse, testability analysis

وصف الملف: application/postscript

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.2.8524

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.2.8524

المؤلفون: Francesco Grasso, Alberto Reatti, Antonio Luchetta, Maria Cristina Piccirilli, Giuseppe Fontana, Stefano Manetti

المصدر: SMACD

مصطلحات موضوعية: Complex field, Testability analysis, Analogue electronics, Computer science, business.industry, 020208 electrical & electronic engineering, 020206 networking & telecommunications, 02 engineering and technology, Function (mathematics), Upper and lower bounds, Software, 0202 electrical engineering, electronic engineering, information engineering, Fault model, business, Algorithm, Complex plane

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::74ca9800e06c5f635a94bb0afd047cb8
https://doi.org/10.1109/smacd.2018.8434864