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1Academic Journal
المؤلفون: Kavousianos, X., Chakrabarty, K., Jain, A., Parekhji, R.
مصطلحات موضوعية: integer programming, linear programming, low-power electronics, multiprocessing systems, scheduling, system-on-chip, core switches, defect screening, dynamic voltage scaling, fast heuristic methods, integer linear programming, low power consumption, multicore system-on-chip, multivoltage domain testing, power supply voltage levels, state retention, test cost, test schedule optimization, test time, voltage islands, Complexity theory, Job shop scheduling, Multicore processing, Optimization, Schedules, System-on-a-chip, Testing, Core-based testing, SoC test scheduling, multicore systems-on-a-chip (SoCs)
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2
مصطلحات موضوعية: Optimization, Linear programming, Computer science, Testing, Core-based testing, Hardware_PERFORMANCEANDRELIABILITY, fast heuristic methods, Scheduling (computing), integer linear programming, power supply voltage levels, Low-power electronics, system-on-chip, multivoltage domain testing, test time, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, System on a chip, SoC test scheduling, scheduling, Electrical and Electronic Engineering, low power consumption, Integer programming, integer programming, dynamic voltage scaling, core switches, test schedule optimization, Multi-core processor, Schedules, business.industry, Complexity theory, state retention, linear programming, Job shop scheduling, multicore systems-on-a-chip (SoCs), Computer Graphics and Computer-Aided Design, test cost, Dynamic voltage scaling, multiprocessing systems, Multicore processing, Embedded system, multicore system-on-chip, defect screening, low-power electronics, voltage islands, System-on-a-chip, business, Software, Voltage