المؤلفون: Balasubramanyam, Shashank, Bloodgood, Matthew, van Ommeren, M., Faraz, Tahsin, Vandalon, Vincent, Kessels, W.M.M. (Erwin), Verheijen, Marcel A., Bol, Ageeth A.

المصدر: Balasubramanyam , S , Bloodgood , M , van Ommeren , M , Faraz , T , Vandalon , V , Kessels , W M M , Verheijen , M A & Bol , A A 2020 , ' Probing the origin and suppression of vertically oriented nanostructures of 2D WS2 layers ' , ACS Applied Materials & Interfaces , vol. 12 , no. 3 , pp. 3873-3885 . https://doi.org/10.1021/acsami.9b19716

مصطلحات موضوعية: 2D WS, grain size, low-temperature processing, plasma-enhanced atomic layer deposition, suppression of 2D vertical layers, vertical growth of 2D layers

وصف الملف: application/pdf

الاتاحة: https://research.tue.nl/en/publications/70cf386a-4d2d-47d1-88c2-4f0f2afcbdf5
https://doi.org/10.1021/acsami.9b19716
https://pure.tue.nl/ws/files/173719532/WS2_ALD_Fin_growth_and_suppression_Supporting_Info.pdf
https://pure.tue.nl/ws/files/173719536/WS2_ALD_Fin_growth_and_suppression.pdf
https://pure.tue.nl/ws/files/146208813/acsami.9b19716.pdf
http://www.scopus.com/inward/record.url?scp=85078194656&partnerID=8YFLogxK