المؤلفون: N.R. Ilnytskyi, T.R. Sorokhtey, V.M. Umantsiv, M.F. Pavlyuk, L.I. Nykyruy, R.V. Ilnytskyi

المصدر: Фізика і хімія твердого тіла, Vol 25, Iss 2, Pp 375-379 (2024)

مصطلحات موضوعية: digital-to-analogue converter, microwind software, submicron technology, Physics, QC1-999

وصف الملف: electronic resource

Relation: https://journals.pnu.edu.ua/index.php/pcss/article/view/8044; https://doaj.org/toc/1729-4428; https://doaj.org/toc/2309-8589

URL الوصول: https://doaj.org/article/b0856c31c49a4e728479688f28c1fe5d

المؤلفون: Никируй Л.І., Ільницький Р.В., Павлюк М.Ф., Федосов С.А., Пташенчук В.В

المصدر: Perspective technologies and devices; Vol 1 No 23 (2023): PERSPECTIVE TECHNOLOGIES AND DEVICES; 67-71 ; Перспективні технології та прилади; Том 1 № 23 (2023): ПЕРСПЕКТИВНІ ТЕХНОЛОГІЇ ТА ПРИЛАДИ; 67-71 ; 2313-5352 ; 10.36910/6775-2313-5352-2023-23

مصطلحات موضوعية: RS-Trigger, T-Trigger, Microprocessor, PTS-Transistor, Submicron Technology, RS-тригер, T-тригер, мікропроцесор, ПТШ-транзистор, субмікронна технологія

وصف الملف: application/pdf

Relation: https://eforum.lntu.edu.ua/index.php/jurnal/article/view/1247/1145; https://eforum.lntu.edu.ua/index.php/jurnal/article/view/1247

الاتاحة: https://eforum.lntu.edu.ua/index.php/jurnal/article/view/1247
https://doi.org/10.36910/10.36910/6775-2313-5352-2023-23-09

المؤلفون: Kim Ho Yeap, Yong Jun Tan, Yue Hong Chong, Siu Hong Loh, Jia Jia Sim, Ahmad Uzair Mazlan

المصدر: Applications of Modelling and Simulation, Vol 7, Pp 63-70 (2023)

مصطلحات موضوعية: asic, deep submicron technology, digital clock, modulus counter, vlsi, Engineering (General). Civil engineering (General), TA1-2040, Technology (General), T1-995

وصف الملف: electronic resource

Relation: http://arqiipubl.com/ojs/index.php/AMS_Journal/article/view/387/151; https://doaj.org/toc/2600-8084

URL الوصول: https://doaj.org/article/99a2ea84fe1a403a979a4c12199be0c6

المؤلفون: Yeap, Kim Ho, Tan, Yong Jun, Chong, Yue Hong, Loh, Siu Hong, Sim, Jia Jia, Mazlan, Ahmad Uzair

المصدر: Applications of Modelling and Simulation; Vol 7 (2023); 63-70 ; 2600-8084

مصطلحات موضوعية: ASIC, Deep submicron technology, Digital clock, Modulus counter, VLSI

وصف الملف: application/pdf

Relation: http://arqiipubl.com/ojs/index.php/AMS_Journal/article/view/387/151; http://arqiipubl.com/ojs/index.php/AMS_Journal/article/view/387

الاتاحة: http://arqiipubl.com/ojs/index.php/AMS_Journal/article/view/387

Thesis Advisors: Gómez Galán, Juan Antonio, Universidad de Huelva. Departamento de Ingeniería Electrónica, de Sistemas Informáticos y Automática

مصطلحات موضوعية: Transistores MOS complementarios, Electrónica, Física nuclear, Sistemas electrónicos front-end, Técnicas de incremento de ganancia, Tecnología CMOS submicrométrica, Detectores semiconductores de radiación, Analog readout front-end, Gain boosting techniques, CMOS submicron technology, Semiconductor radiation detectors, Nuclear physics

URL الوصول: http://hdl.handle.net/10272/11410

المؤلفون: López de Ahumada Gutiérrez, Rafael

Thesis Advisors: Gómez Galán, Juan Antonio, Universidad de Huelva. Departamento de Ingeniería Electrónica, de Sistemas Informáticos y Automática

مصطلحات موضوعية: Transistores MOS complementarios, Electrónica, Física nuclear, Sistemas electrónicos front-end, Técnicas de incremento de ganancia, Tecnología CMOS submicrométrica, Detectores semiconductores de radiación, Analog readout front-end, Gain boosting techniques, CMOS submicron technology, Semiconductor radiation detectors, Nuclear physics

URL الوصول: http://hdl.handle.net/10272/11410

المؤلفون: Novosyadliy, S.P., Gryga, V.M., Kurysh, I.I., Melnyk , M.I.

المصدر: Physics and Chemistry of Solid State; Vol. 19 No. 4 (2018); 352-357 ; Фізика і хімія твердого тіла; Том 19 № 4 (2018); 352-357 ; 2309-8589 ; 1729-4428

مصطلحات موضوعية: field transistors, submicron technology, LSI, польові транзистори, субмікронні технології, ВІС

وصف الملف: application/pdf

Relation: https://journals.pnu.edu.ua/index.php/pcss/article/view/590/658; https://journals.pnu.edu.ua/index.php/pcss/article/view/590/659; https://journals.pnu.edu.ua/index.php/pcss/article/view/590

الاتاحة: https://journals.pnu.edu.ua/index.php/pcss/article/view/590
https://doi.org/10.15330/pcss.19.4.352-357

المؤلفون: Mourad Hebali, Mohammed Barka, Abdelkader Baghdad Bey, Miloud Abboun Abid, Mohammed Benzohra, Djilali Chalabi, Abdelkader Saïdane

المصدر: ICTACT Journal on Microelectronics, Vol 4, Iss 3, Pp 665-668 (2018)

مصطلحات موضوعية: solar cell, i-v characteristic, p-v characteristic, form factor ff, submicron technology, Electronics, TK7800-8360

Relation: http://ictactjournals.in/paper/IJME_Vol_4_Iss_3_Paper_9_665_668.pdf; https://doaj.org/toc/2395-1672; https://doaj.org/toc/2395-1680; https://doaj.org/article/3abb9b7c611f41a08c0b23cb804a63f3

الاتاحة: https://doi.org/10.21917/ijme.2018.0115
https://doaj.org/article/3abb9b7c611f41a08c0b23cb804a63f3

المؤلفون: Tsoumanis P., Paliaroutis G.-I., Evmorfopoulos N., Stamoulis G.

المصدر: Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT ; https://www.scopus.com/inward/record.uri?eid=2-s2.0-85142890369&doi=10.1109%2fDFT52944.2021.9568306&partnerID=40&md5=84211665b9eb8b5bf3fea1d0fbebf346

مصطلحات موضوعية: Error correction, Integrated circuit interconnects, Radiation hardening, Transients, Deep submicron technology, Electrical masking, Interconnection delay, Soft error, Soft error rate, Soft error rate estimations, Static timing analysis, Timing Analysis, Timing masking, Transient faults, Timing circuits, Institute of Electrical and Electronics Engineers Inc

Relation: http://hdl.handle.net/11615/80176

الاتاحة: http://hdl.handle.net/11615/80176
https://doi.org/10.1109/DFT52944.2021.9568306

المؤلفون: Goiffon, Vincent, Magnan, Pierre, Bernard, Frédéric, Rolland, Guy, Saint-Pé, Olivier, Huger, Nicolas, Corbière, Franck

المساهمون: Institut Supérieur de l'Aéronautique et de l'Espace - ISAE-SUPAERO (FRANCE), EADS - Astrium (FRANCE), Centre National d'Études Spatiales - CNES (FRANCE)

مصطلحات موضوعية: Optique, CMOS image sensor, CIS, APS, Deep submicron technology, Ionizing radiation, Total dose, Dark current, STI, Hardening by design, RHDB

وصف الملف: application/pdf

Relation: https://oatao.univ-toulouse.fr/299/1/Goiffon_299.pdf; Goiffon, Vincent and Magnan, Pierre and Bernard, Frédéric and Rolland, Guy and Saint-Pé, Olivier and Huger, Nicolas and Corbière, Franck. Ionizing radiation effects on CMOS imagers manufactured in deep submicron process. (2008) In: SPIE Electronic Imaging 2008 : Sensors, Cameras, and Systems for Industrial/Scientific Applications IX, 27-31 Jan 2008, San Jose, United States .

الاتاحة: https://oatao.univ-toulouse.fr/299/
https://oatao.univ-toulouse.fr/299/1/Goiffon_299.pdf
https://doi.org/10.1117/12.767484

المؤلفون: Salendra Govindarajulu, Dr.T.Jayachandra Prasad, C.Sreelakshmi, Chandrakala, U.Thirumalesh

مصطلحات موضوعية: Dynamic, Domino, Noise Margin, Very Deep submicron technology, High speed, Power consumption, Power delay product (PDP)

Relation: http://dx.doi.org/10.14569/IJACSA.2011.020417

الاتاحة: https://doi.org/10.14569/IJACSA.2011.020417

المؤلفون: Новосядлий, Степан Петрович, Вівчарук, Володимир Михайлович

المصدر: Eastern-European Journal of Enterprise Technologies

مصطلحات موضوعية: Прикладна та теоретична фізика, еліпсометрія, кремній, субмікронна технологія, методи контролю, літографія, УДК 621.382.8, эллипсометрия, кремний, субмикронная технология, методы контроля, литография, ellipsometry, silicon, submicron technology, testing methods, lithography, Indonesia

وصف الملف: application/pdf

Relation: https://www.neliti.com/publications/303261/%D0%B5%D0%BB%D1%96%D0%BF%D1%81%D0%BE%D0%BC%D0%B5%D1%82%D1%80%D1%96%D1%8F-%D0%B2-%D1%81%D1%83%D0%B1%D0%BC%D1%96%D0%BA%D1%80%D0%BE%D0%BD%D0%BD%D1%96%D0%B9-%D1%82%D0%B5%D1%85%D0%BD%D0%BE%D0%BB%D0%BE%D0%B3%D1%96%D1%97-%D1%84%D0%BE%D1%80%D0%BC%D1%83%D0%B2%D0%B0%D0%BD%D0%BD%D1%8F-%D1%81%D1%82%D1%80%D1%83%D0%BA%D1%82%D1%83%D1%80-%D0%B2%D1%96%D1%81

الاتاحة: https://www.neliti.com/publications/303261/%D0%B5%D0%BB%D1%96%D0%BF%D1%81%D0%BE%D0%BC%D0%B5%D1%82%D1%80%D1%96%D1%8F-%D0%B2-%D1%81%D1%83%D0%B1%D0%BC%D1%96%D0%BA%D1%80%D0%BE%D0%BD%D0%BD%D1%96%D0%B9-%D1%82%D0%B5%D1%85%D0%BD%D0%BE%D0%BB%D0%BE%D0%B3%D1%96%D1%97-%D1%84%D0%BE%D1%80%D0%BC%D1%83%D0%B2%D0%B0%D0%BD%D0%BD%D1%8F-%D1%81%D1%82%D1%80%D1%83%D0%BA%D1%82%D1%83%D1%80-%D0%B2%D1%96%D1%81

المؤلفون: Wirbel, Loring

المصدر: Electronic Engineering Times (01921541). 2/26/96, Issue 890, p18. 2p.

الشركة/الكيان: ROCKWELL Semiconductor Systems Ltd. , SUBMICRON Technology Co. Ltd.

المؤلفون: Toshinari Takayanagi, Jinuk Luke Shin, Bruce Petrick, Jeffrey Su, Ana Sonia Leon

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: http://www.cs.york.ac.uk/rts/docs/SIGDA-Compendium-1994-2004/papers/2004/dac04/pdffiles/p673.pdf.

مصطلحات موضوعية: B.7.1 [Integrated Circuits, Types and Design Styles – Advanced technologies, Memory technologies, Microprocessors and microcomputers, Standard cells, VLSI, B.3.2 [Memory Structures, Design Styles – Associative memories, Cache memories, B.8.1 [Performance and Reliability, Reliability, Testing, and Fault-Tolerance, C.1.2 [Processor Architectures, Multiple Data Stream Architectures (Microprocessors) General Terms Performance, Design, Reliability Keywords Multiprocessor, Dual-core, UltraSPARC, Dense server, Throughput computing, Deep submicron technology, cache, leakage, Negative Bias Temperature Instability, NBTI, Coupling noise, L2 Copyright is held by Sun Microsystems, Inc

وصف الملف: application/pdf

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.386.8258; http://www.cs.york.ac.uk/rts/docs/SIGDA-Compendium-1994-2004/papers/2004/dac04/pdffiles/p673.pdf

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.386.8258
http://www.cs.york.ac.uk/rts/docs/SIGDA-Compendium-1994-2004/papers/2004/dac04/pdffiles/p673.pdf

المؤلفون: Carroll, Mark

المصدر: Electronic Engineering Times (01921541). 06/02/97, Issue 956, p32. 3/7p.

الشركة/الكيان: SUBMICRON Technology Co. Ltd.

المؤلفون: McHale, Tom

المصدر: Electronic Buyers' News. 6/19/95, Issue 960, p2. 2p.

مصطلحات موضوعية: *SEMICONDUCTOR industry

مصطلحات جغرافية: THAILAND, CHINA

الشركة/الكيان: SUBMICRON Technology Co. Ltd. , GTA Semiconductor Co. Ltd.

المؤلفون: Erkanat, Judy

المصدر: Electronic News. 06/23/97, Vol. 43 Issue 2173, p1. 2p.

مصطلحات موضوعية: *FINANCE

الشركة/الكيان: SUBMICRON Technology Co. Ltd.

المؤلفون: Bongiovanni, Simone

مصطلحات موضوعية: side channel attacks, cryptography, power analysis attacks, digital design, VLSI, submicron technology, hardware security, leakage, Settore ING-INF/01 - Elettronica

URL الوصول: https://explore.openaire.eu/search/publication?articleId=od______3686::626dce8caaf9f98b07612192deb175c3
http://hdl.handle.net/11573/1265920

المؤلفون: Persson, S., Zhou, D., Zhang, Shi-Li, Östling, Mikael

المصدر: Microelectronic Engineering. 55(04-jan):19-28

مصطلحات موضوعية: VLSI physical design, buffer insertion, deep submicron technology, minimum delay and power

وصف الملف: print

URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-20491

المؤلفون: Akram, Shoaib, Cromar, Scott A., Lucas, Gregory, Papakonstantinou, Alexandros, Chen, Deming

مصطلحات موضوعية: integrated circuit design, system-on-chip, application-specific multicore, deep submicron technology, error-resilient computation, holistic error modeling, onchip parameter variations, soft-hard errors, variation-aware synthesis

Relation: http://hdl.handle.net/2142/9687; IEEE/ACM Asia and South Pacific Design Automation Conference, January 2008

الاتاحة: http://hdl.handle.net/2142/9687
https://doi.org/10.1109/ASPDAC.2008.4484062