المؤلفون: Sung, Min-Jun, Seo, Dae-Gyo, Kim, Jingwan, Baek, Ho Eon, Go, Gyeong-Tak, Woo, Seung-Je, Kim, Kwan-Nyeong, Yang, Hoichang, Kim, Yun-Hi, Lee, Tae-Woo

المساهمون: Lee, Tae-Woo

مصطلحات موضوعية: THIN-FILM TRANSISTORS, AGGREGATION, DIELECTRICS, CAPACITANCE, WEIGHT, blending polymer semiconductors, efficient electrochemical doping, high state retention, restriction of morphological changes, side chain engineering

Relation: Advanced Functional Materials, Vol.34 No.14; https://hdl.handle.net/10371/198775; 001129210300001; 2-s2.0-85180474109; 203312

الاتاحة: https://hdl.handle.net/10371/198775
https://doi.org/10.1002/adfm.202312546

المؤلفون: Sedighiani, Shima, Singh, Kamlesh, Jordans, Roel, Harpe, Pieter, de Gyvez, Jose Pineda

المصدر: Sedighiani , S , Singh , K , Jordans , R , Harpe , P & de Gyvez , J P 2023 , ' A 380 fW Leakage Data Retention Flip-Flop for Short Sleep Periods ' , IEEE Transactions on Circuits and Systems II: Express Briefs , vol. 70 , no. 7 , 10024364 , pp. 2650-2654 . https://doi.org/10.1109/TCSII.2023.3238961

مصطلحات موضوعية: data/state retention, Delays, dynamic leakage suppression, Energy consumption, Flip-flop, Inverters, Latches, Power demand, Standards, Transistors, ultra-low power, /dk/atira/pure/sustainabledevelopmentgoals/affordable_and_clean_energy, name=SDG 7 - Affordable and Clean Energy

وصف الملف: application/pdf

الاتاحة: https://research.tue.nl/en/publications/fd1bc816-8f9a-49fb-afb9-6b097064aa1a
https://doi.org/10.1109/TCSII.2023.3238961
https://pure.tue.nl/ws/files/302804167/A_380_fW_Leakage_Data_Retention_Flip-Flop_for_Short_Sleep_Periods.pdf
http://www.scopus.com/inward/record.url?scp=85147311624&partnerID=8YFLogxK

المؤلفون: Kim, Taehwan, Park, Heechun, Kim, Taewhan

المساهمون: Kim, Taewhan

مصطلحات موضوعية: Clocks, Resource management, Logic gates, Monitoring, Integrated circuit modeling, Steady-state, Hardware design languages, Allocation, leakage power, logic design, optimization, power gating, state retention

Relation: https://hdl.handle.net/10371/209396; 000622096700005; 126551

الاتاحة: https://hdl.handle.net/10371/209396
https://doi.org/10.1109/TVLSI.2020.3047056

المؤلفون: Hyun, Gyounghwan, Kim, Taewahn

المساهمون: Kim, Taewahn

مصطلحات موضوعية: Resource management, Delays, Latches, Hardware design languages, Clocks, Power demand, Logic gates, Low power, power gating, retention flip-flop, state retention

Relation: https://hdl.handle.net/10371/209381; 000641964100007; 132689

الاتاحة: https://hdl.handle.net/10371/209381
https://doi.org/10.1109/TCAD.2020.3013243

المؤلفون: Zimu Zhou (5860970), Pedro López-Domínguez (8909834), Muhammad Abdullah (3357692), Dylan M. Barber (10738946), Xiangxi Meng (5905178), Jieun Park (2560948), Isabel Van Driessche (7388546), Jessica D. Schiffman (1396117), Alfred J. Crosby (791471), Kevin R. Kittilstved (1421083), Stephen S. Nonnenmann (1701136)

مصطلحات موضوعية: Biophysics, Cell Biology, Genetics, Neuroscience, Ecology, Infectious Diseases, Chemical Sciences not elsewhere classified, monomodal assemblies, Memristive Behavior, memristive nanocrystal assemblies l., V TH, earth substitution decrease, solution-processed nanoribbon assem., nanoribbon heterogeneity, state retention, SZO, monomodal diameter nanocrystals, assembly, high-resistance states, bimodal nanocrystal mixtures, trap-mediated space-charge-limited, trap-assisted tunneling processes drive, defect-mediated electrochemical rea., BZO, monomodal vs bimodal size distributions, BaZrO 3, film layers, nanocrystal size, Mixed Oxide Nanocrystal Assemblies, A-site substitution

Relation: https://figshare.com/articles/journal_contribution/Memristive_Behavior_of_Mixed_Oxide_Nanocrystal_Assemblies/14529362

الاتاحة: https://doi.org/10.1021/acsami.1c03722.s001

المؤلفون: Steudel, S., van der Steen, J.L.P.J., Nag, M., Ke, T.H., Smout, S., Bel, T., van Diesen, K., de Haas, G., Maas, J., de Riet, J., Rovers, M., Verbeek, R., Huang, Y.Y., Chiang, S.C., Ameys, M., De Roose, F., Dehaene, W., Genoe, J., Heremans, P., Gelinck, G.H., Kronemeijer, A.J.

المصدر: Steudel , S , van der Steen , J L P J , Nag , M , Ke , T H , Smout , S , Bel , T , van Diesen , K , de Haas , G , Maas , J , de Riet , J , Rovers , M , Verbeek , R , Huang , Y Y , Chiang , S C , Ameys , M , De Roose , F , Dehaene , W , Genoe , J , Heremans , P , Gelinck , G H & Kronemeijer , A J 2017 , ....

مصطلحات موضوعية: AMOLED, flexible displays, metal-oxide semiconductors, self-aligned TFT, state retention

Relation: https://research.tue.nl/en/publications/5203affd-47af-4df2-a7fe-4ac6031b54b1

الاتاحة: https://research.tue.nl/en/publications/5203affd-47af-4df2-a7fe-4ac6031b54b1
https://doi.org/10.1002/jsid.544
http://www.scopus.com/inward/record.url?scp=85018401357&partnerID=8YFLogxK

المؤلفون: Kore, L. J

المصدر: International Research Journal of Multidisciplinary Studies; Vol 2, No 3 (2016): IRJMS & SPPP's, Karmayogi Engineering College, National Conference Special Issue March 2016 ; 2454-8499

مصطلحات موضوعية: LPSR Technique, leakage power, state retention, total power, E and TC

وصف الملف: application/pdf

Relation: http://irjms.in/index.php/files/article/view/196/218; http://irjms.in/index.php/files/article/view/196

الاتاحة: http://irjms.in/index.php/files/article/view/196

المؤلفون: Shima Sedighiani, Kamlesh Singh, Roel Jordans, Pieter Harpe, Jose Pineda de Gyvez

المصدر: IEEE Transactions on Circuits and Systems II: Express Briefs. :1-1

مصطلحات موضوعية: Flip-flop, Standards, Inverters, Latches, Transistors, dynamic leakage suppression, Energy consumption, data/state retention, Power demand, SDG 7 - Affordable and Clean Energy, Delays, ultra-low power, Electrical and Electronic Engineering, SDG 7 – Betaalbare en schone energie

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::67037884af03eb58e7e0e07eca435909
https://doi.org/10.1109/tcsii.2023.3238961

المؤلفون: Rajani H.P, Srimannarayan Kulkarni

مصطلحات موضوعية: Leakage power, sleep transistor, power gating, average power, state retention

Relation: https://doi.org/10.5121/vlsic.2012.3408; oai:zenodo.org:2552007

الاتاحة: https://doi.org/10.5121/vlsic.2012.3408

المؤلفون: 김태환

المساهمون: 김태환, Kim, Tae Hwan, 공과대학 전기·정보공학부

مصطلحات موضوعية: SRAM, on-chip monitoring, process variation, power gating, state retention, leakage power, 정적 램, 온-칩 모니터링, 공정 변이, 파워 게이팅, 상태 보존, 누설 전력, 621.3

وصف الملف: xii, 98

Relation: 000000166642; https://hdl.handle.net/10371/178743; https://dcollection.snu.ac.kr/common/orgView/000000166642; I804:11032-000000166642; 000000000046▲000000000053▲000000166642▲

الاتاحة: https://hdl.handle.net/10371/178743
https://dcollection.snu.ac.kr/common/orgView/000000166642

المؤلفون: Ahmed, Saad, Bhatti, Naavid, Brachmann, Martina, Alizai, Hamad

المصدر: Journal of systems architecture. 115

مصطلحات موضوعية: Checkpointing, Intermittent computing, Program-state retention, Transiently-powered computers, Application programs, Digital storage, Energy harvesting, Surveys, Application progress, Device operations, Embedded device, Embedded sensing, Maintenance cost, Maintenance free, Retaining programs, State of the art, Embedded systems

وصف الملف: print

URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:ri:diva-52196

المصدر: SID International Symposium : Digest of Technical Papers. 48(1):38-41

مصطلحات موضوعية: Metal-oxide semiconductors, AMOLED, State retention, Self-aligned TFT, Flexible displays

URL الوصول: https://explore.openaire.eu/search/publication?articleId=dris___00893::295f7bd276dd0ea2d7dbdeef262cb14d
http://www.scopus.com/inward/record.url?scp=85044476853&partnerID=8YFLogxK

المؤلفون: Atsuo Isobe, Atsushi Hirose, Gensuke Goto, Hidetoshi Mimura, Hikaru Tamura, Jun Koyama, Kazuaki Ohshima, Kazuma Furutani, Kiyoshi Kato, Masahiro Fujita, Naoaki Tsutsui, Niclas Sjokvist, Shunpei Yamazaki, Takahiko Ishizu, Takanori Matsuzaki, Takuro Ohmaru, Tatsuya Onuki, Tomoaki Atsumi, Wataru Uesugi, Yasutaka Suzuki, Yoshinori Ieda, Yutaka Shionoiri

المصدر: JSAP Annual Meetings Extended Abstracts. 2013, :2264

المؤلفون: Akira TADA, Hiromi NOTANI, Masahiro NUMA

المصدر: IEICE Electronics Express. 2006, 3(12):281

المؤلفون: Steudel, S., Steen, J.L. van der, Nag, M., Ke, T.H., Smout, S., Bel, T., Diesen, K. van, Haas, G. de, Maas, J., Riet, J. de, Rovers, M., Verbeek, R., Huang, Y.Y., Chiang, S.C., Ameys, M., Roose, F. de, Dehaene, W., Genoe, J., Heremans, P., Gelinck, G., Kronemeijer, A.J.

المصدر: SID Symposium Digest of Technical Papers, 1, 48, 38-41

مصطلحات موضوعية: Electronics, Flexible displays, AMOLED, Metal-oxide semiconductors, Self-aligned TFT, State retention, Industrial Innovation, Nano Technology, HOL - Holst, TS - Technical Sciences

Relation: uuid:5de4a87a-6751-4b12-aa75-42bb603d2647; 780625; http://resolver.tudelft.nl/uuid:5de4a87a-6751-4b12-aa75-42bb603d2647

الاتاحة: http://resolver.tudelft.nl/uuid:5de4a87a-6751-4b12-aa75-42bb603d2647

المؤلفون: Gerwin H. Gelinck, Gerard de Haas, Jan-Laurens van der Steen, Auke Jisk Kronemeijer, Joris Maas, Joris de Riet, Shin-Chuan Chiang, Yen-Yu Huang, Roy Verbeek, Steve Smout, Karin van Diesen, Thijs Bel, Tung Huei Ke, Paul Heremans, Wim Dehaene, Jan Genoe, Soeren Steudel, Florian De Roose, Marc Ameys, Manoj Nag, Madelon Rovers

المصدر: SID Symposium Digest of Technical Papers, 1, 48, 38-41

مصطلحات موضوعية: Metal-oxide semiconductors, Engineering, TS - Technical Sciences, Industrial Innovation, business.industry, State retention, Electrical engineering, HOL - Holst, law.invention, Power (physics), Flexible displays, AMOLED, Backplane, Thin-film transistor, law, Flexible display, Nano Technology, Self-aligned TFT, Electronics, Photolithography, business, AND gate

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fc33c63151278e542cf9407bd20654a4
http://resolver.tudelft.nl/uuid:5de4a87a-6751-4b12-aa75-42bb603d2647

المؤلفون: Asch, Beth J, Mattock, Michael G, Hosek, James

المساهمون: RAND NATIONAL DEFENSE RESEARCH INST SANTA MONICA CA

المصدر: DTIC

مصطلحات موضوعية: Personnel Management and Labor Relations, Military Forces and Organizations, RETIREMENT(PERSONNEL), VETERANS(MILITARY PERSONNEL), COMPENSATION, COST REDUCTION, MODELS, PERSONNEL RETENTION, STEADY STATE, MCRMC(MILITARY COMPENSATION AND RETIREMENT MODERNIZATION COMMISSION), DRM(DYNAMIC RETENTION MODEL), STEADY-STATE RETENTION RESULTS

وصف الملف: text/html

Relation: http://www.dtic.mil/docs/citations/ADA621477

الاتاحة: http://www.dtic.mil/docs/citations/ADA621477
http://oai.dtic.mil/oai/oai?&verb=getRecord&metadataPrefix=html&identifier=ADA621477

المؤلفون: Kavousianos, X., Chakrabarty, K., Jain, A., Parekhji, R.

مصطلحات موضوعية: integer programming, linear programming, low-power electronics, multiprocessing systems, scheduling, system-on-chip, core switches, defect screening, dynamic voltage scaling, fast heuristic methods, integer linear programming, low power consumption, multicore system-on-chip, multivoltage domain testing, power supply voltage levels, state retention, test cost, test schedule optimization, test time, voltage islands, Complexity theory, Job shop scheduling, Multicore processing, Optimization, Schedules, System-on-a-chip, Testing, Core-based testing, SoC test scheduling, multicore systems-on-a-chip (SoCs)

Relation: http://olympias.lib.uoi.gr/jspui/handle/123456789/11085

الاتاحة: http://olympias.lib.uoi.gr/jspui/handle/123456789/11085

المؤلفون: Sjökvist, Niclas

مصطلحات موضوعية: Normally Off, Low Power, Microprocessor, Nonvolatile, Power Gating, State Retention, Flip Flop, CAAC, IGZO

وصف الملف: application/pdf

الاتاحة: http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-100812

المؤلفون: Arvind Jain, Xrysovalantis Kavousianos, Krishnendu Chakrabarty, Rubin A. Parekhji

مصطلحات موضوعية: Optimization, Linear programming, Computer science, Testing, Core-based testing, Hardware_PERFORMANCEANDRELIABILITY, fast heuristic methods, Scheduling (computing), integer linear programming, power supply voltage levels, Low-power electronics, system-on-chip, multivoltage domain testing, test time, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, System on a chip, SoC test scheduling, scheduling, Electrical and Electronic Engineering, low power consumption, Integer programming, integer programming, dynamic voltage scaling, core switches, test schedule optimization, Multi-core processor, Schedules, business.industry, Complexity theory, state retention, linear programming, Job shop scheduling, multicore systems-on-a-chip (SoCs), Computer Graphics and Computer-Aided Design, test cost, Dynamic voltage scaling, multiprocessing systems, Multicore processing, Embedded system, multicore system-on-chip, defect screening, low-power electronics, voltage islands, System-on-a-chip, business, Software, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a408dddeb4fcf752e6e4056895952725
http://olympias.lib.uoi.gr/jspui/handle/123456789/11085