المؤلفون: D. S. Borovitsky, A. E. Zhesterev, V. P Ipatov, R. M. Mamchur

المصدر: Известия высших учебных заведений России: Радиоэлектроника, Vol 0, Iss 2, Pp 5-11 (2018)

مصطلحات موضوعية: space-based altimeter, time discriminator, echo-signal, equivalent time fluctuation variance, Electronics, TK7800-8360

وصف الملف: electronic resource

Relation: https://re.eltech.ru/jour/article/view/214; https://doaj.org/toc/1993-8985; https://doaj.org/toc/2658-4794

URL الوصول: https://doaj.org/article/dd6e233d3bac4681ad8596baf016f357

المؤلفون: D. S. Borovitsky, A. E. Zhesterev, V. P. Ipatov, R. M. Mamchur

المصدر: Известия высших учебных заведений России: Радиоэлектроника, Vol 0, Iss 5, Pp 12-19 (2017)

مصطلحات موضوعية: space-based altimeter, reflective surface, specular point, echo-signal, Electronics, TK7800-8360

وصف الملف: electronic resource

Relation: https://re.eltech.ru/jour/article/view/189; https://doaj.org/toc/1993-8985; https://doaj.org/toc/2658-4794

URL الوصول: https://doaj.org/article/5e8d3daa0c1f45cc897b59a7a8911394

المؤلفون: R. M. Mamchur, V. P. Ipatov, D. S. Borovitsky, A. E. Zhesterev

المصدر: Известия высших учебных заведений России: Радиоэлектроника, Vol 0, Iss 1, Pp 5-12 (2018)
Известия высших учебных заведений России: Радиоэлектроника, Vol 0, Iss 2, Pp 5-11 (2018)

مصطلحات موضوعية: Discriminator, satellite altimeter, TK7800-8360, Computer science, time discriminator, equivalent time fluctuation variance, 02 engineering and technology, Tracking (particle physics), Signal, 01 natural sciences, law.invention, Satellite altimeter, delay-lock loop, echo-signal, law, Control theory, discriminator curve, Delay-locked loop, 0202 electrical engineering, electronic engineering, information engineering, Altimeter, Remote sensing, Satellite radar, Echo signal, 010401 analytical chemistry, 020206 networking & telecommunications, space-based altimeter, 0104 chemical sciences, Loop (topology), ComputingMethodologies_PATTERNRECOGNITION, Radar altimeter, Electronics, Geology

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e9943ae7891586756ef1744c2cb46a80
https://re.eltech.ru/jour/article/view/203