المؤلفون: Sina Mayr, Simone Finizio, Joakim Reuteler, Stefan Stutz, Carsten Dubs, Markus Weigand, Aleš Hrabec, Jörg Raabe, Sebastian Wintz

المصدر: Crystals; Volume 11; Issue 5; Pages: 546

مصطلحات موضوعية: Xe plasma focused ion beam, soft X-ray transparency, transmission X-ray microscopy

وصف الملف: application/pdf

Relation: Inorganic Crystalline Materials; https://dx.doi.org/10.3390/cryst11050546

الاتاحة: https://doi.org/10.3390/cryst11050546

المؤلفون: Mayr, S., Finizio, S., Reuteler, J., Stutz, S., Dubs, C., Weigand, M., Hrabec, A., Raabe, J., Wintz, S.

مصطلحات موضوعية: Xe plasma focused ion beam, soft X ray transparency, transmission X ray microscopy

وصف الملف: application/pdf

Relation: http://www.helmholtz-berlin.de/pubbin/oai_publication?VT=1&ID=103720

الاتاحة: http://www.helmholtz-berlin.de/pubbin/oai_publication?VT=1&ID=103720

المؤلفون: Carsten Dubs, Simone Finizio, Aleš Hrabec, Jörg Raabe, Joakim Reuteler, Stefan Stutz, Markus Weigand, Sina Mayr, Sebastian Wintz

المصدر: Crystals, Vol 11, Iss 546, p 546 (2021)
Crystals, 11 (5)
Crystals
Volume 11
Issue 5

مصطلحات موضوعية: Fabrication, Materials science, General Chemical Engineering, chemistry.chemical_element, 02 engineering and technology, Electron, soft X-ray transparency, Epitaxy, 01 natural sciences, Focused ion beam, Inorganic Chemistry, Xenon, Xe plasma focused ion beam, soft X ray transparency, transmission X ray microscopy, 0103 physical sciences, Microscopy, General Materials Science, 010306 general physics, Transmission X-ray microscopy, Soft x ray, Crystallography, business.industry, Plasma, 021001 nanoscience & nanotechnology, Condensed Matter Physics, chemistry, QD901-999, Optoelectronics, 0210 nano-technology, business

وصف الملف: application/pdf; application/application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::55c4cbd89b8d43b7de2995fcd8e629fe