المساهمون: Khoo, Yong [Solar Energy Research Institute of Singapore (Singapore)]

المصدر: IEEE Journal of Photovoltaics; 7; 1

وصف الملف: Medium: ED; Size: p. 104-109

URL الوصول: http://www.osti.gov/scitech/servlets/purl/1343086

المؤلفون: Jae-Ho Kim (1319040), Seungsang Cha (11402675), Yoonhee Kim (414380), Jiwoong Son (3345071), Jeong-Eun Park (3345068), Jeong-Wook Oh (1669204), Jwa-Min Nam (1668553)

مصطلحات موضوعية: Medicine, Cell Biology, Molecular Biology, Biotechnology, Ecology, Developmental Biology, Biological Sciences not elsewhere classified, Information Systems not elsewhere classified, wide potential range, narrow optical windows, highly negative potential, faster frequency shift, attracting increasing attention, applied electric potential, unconventional electrochromic behaviors, plasmonic electrochromism based, electrochromic behaviors, plasmonic materials, spectroscopic tools, situ dark, optoelectronic systems, nanocubes show, metallic nanoparticles, gold nanocubes, field electrospectroscopy, electrochemical switching, drude model, classical capacitor, also shown

Relation: https://figshare.com/articles/journal_contribution/Nontrivial_Unconventional_Electrochromic_Behaviors_of_Plasmonic_Nanocubes/16583321

الاتاحة: https://doi.org/10.1021/acs.nanolett.1c01639.s001

المؤلفون: Eiichi Sukedai, Hajime Matsumoto, Hatsujiro Hashimoto, Hiroyuki Yagi, 八木 宏幸, 助台 榮一, 松本 創, 橋本 初次郎

المصدر: 日本金属学会誌 / Journal of the Japan Institute of Metals and Materials. 2001, 65(5):374

المؤلفون: Eiichi Sukedai, Hajime Matsumoto, Hatsujiro Hashimoto, 助台 榮一, 松本 創, 橋本 初次郎

المصدر: 日本金属学会誌 / Journal of the Japan Institute of Metals and Materials. 2000, 64(6):481

المؤلفون: Eiichi Sukedai, Hajime Matsumoto, Hatsujiro Hashimoto, 助台 榮一, 松本 創, 橋本 初次郎

المصدر: 日本金属学会誌 / Journal of the Japan Institute of Metals and Materials. 1999, 63(6):806

المؤلفون: Eiichi Sukedai, Hajime Matsumoto, Hatsujiro Hashimoto

المصدر: Materials Transactions, JIM. 1999, 40(12):1436

المؤلفون: LUO WEI, Hacke, Peter, JAI PRAKASH, CHAI JING, WANG YAN, SEERAM RAMAKRISHNA, ABERLE,ARMIN GERHARD, KHOO YONG SHENG

المساهمون: DEPT OF ELECTRICAL & COMPUTER ENGG, MECHANICAL ENGINEERING, SOLAR ENERGY RESEARCH INST OF S'PORE

المصدر: Elements

مصطلحات موضوعية: Science & Technology, Technology, Physical Sciences, Energy & Fuels, Materials Science, Multidisciplinary, Physics, Applied, In-situ dark I-V (DIV) characterization, module power temperature coefficient, photovoltaic (PV) modules, potential-induced degradation (PID), temperature correction, STACKING-FAULTS, SOLAR-CELLS, PERFORMANCE, EXPLANATION, STRESS

Relation: LUO WEI, Hacke, Peter, JAI PRAKASH, CHAI JING, WANG YAN, SEERAM RAMAKRISHNA, ABERLE,ARMIN GERHARD, KHOO YONG SHENG (2017-01-01). In-Situ Characterization of Potential-Induced Degradation in Crystalline Silicon Photovoltaic Modules Through Dark I-V Measurements. IEEE JOURNAL OF PHOTOVOLTAICS 7 (1) : 104-109. ScholarBank@NUS Repository. https://doi.org/10.1109/JPHOTOV.2016.2621352; https://scholarbank.nus.edu.sg/handle/10635/176845

الاتاحة: https://scholarbank.nus.edu.sg/handle/10635/176845