المؤلفون: Juan B. Roldán, Antonio Cantudo, David Maldonado, Cristina Aguilera-Pedregosa, Enrique Moreno, Timm Swoboda, Francisco Jiménez-Molinos, Yue Yuan, Kaichen Zhu, Mario Lanza, Miguel Muñoz Rojo

مصطلحات موضوعية: Biophysics, Medicine, Biotechnology, Ecology, Cancer, Hematology, Plant Biology, Biological Sciences not elsewhere classified, Chemical Sciences not elsewhere classified, Physical Sciences not elsewhere classified, resistive switching analysis, scanning thermal microscopy, top device surface, thermal measurements instead, thermal compact modeling, standard electrical characterization, thermal responses, thermal resistance, experimental measurements, compact models, device variability, device simulation, whose value, titanium oxide, single fitting, simultaneously recorded, series resistance, reset voltages, operando tracking, indirectly supported

Relation: https://figshare.com/articles/journal_contribution/Thermal_Compact_Modeling_and_Resistive_Switching_Analysis_in_Titanium_Oxide-Based_Memristors/25224732

الاتاحة: https://doi.org/10.1021/acsaelm.3c01727.s001
https://figshare.com/articles/journal_contribution/Thermal_Compact_Modeling_and_Resistive_Switching_Analysis_in_Titanium_Oxide-Based_Memristors/25224732

المؤلفون: Juan B. Roldán, Antonio Cantudo, David Maldonado, Cristina Aguilera-Pedregosa, Enrique Moreno, Timm Swoboda, Francisco Jiménez-Molinos, Yue Yuan, Kaichen Zhu, Mario Lanza, Miguel Muñoz Rojo

مصطلحات موضوعية: Biophysics, Medicine, Biotechnology, Ecology, Cancer, Hematology, Plant Biology, Biological Sciences not elsewhere classified, Chemical Sciences not elsewhere classified, Physical Sciences not elsewhere classified, resistive switching analysis, scanning thermal microscopy, top device surface, thermal measurements instead, thermal compact modeling, standard electrical characterization, thermal responses, thermal resistance, experimental measurements, compact models, device variability, device simulation, whose value, titanium oxide, single fitting, simultaneously recorded, series resistance, reset voltages, operando tracking, indirectly supported

Relation: https://figshare.com/articles/journal_contribution/Thermal_Compact_Modeling_and_Resistive_Switching_Analysis_in_Titanium_Oxide-Based_Memristors/25224732

الاتاحة: https://doi.org/10.1021/acsaelm.3c01727.s001