المساهمون: Ahmed, Musahid

المصدر: Journal of Physical Chemistry A; 115; 15

وصف الملف: Medium: ED; Size: 3279

URL الوصول: http://www.osti.gov/scitech/servlets/purl/1023404

المؤلفون: Takahashi, Lynelle K.

مصطلحات موضوعية: General and Miscellaneous, Inorganic, organic, physical and analytical chemistry, secondary neutral mass spectrometry, secondary ion mass spectrometry, monolignols, coniferyl alcohol, sinapyl alcohol, photoionization, fragmentation

وصف الملف: application/pdf

URL الوصول: https://escholarship.org/uc/item/32d8h86d

المؤلفون: Louerdi, Soukaina, Hrabar, Sviatoslav, Mouhib, Taoufiq, Kański, Michał, Postawa, Zbigniew

مصطلحات موضوعية: graphene, organic materials, carbon based materials, atomic and molecular clusters, secondary neutral mass spectrometry, secondary ion mass spectrometry

Relation: Journal of Chemical Physics, T. 159, nr 20; https://ruj.uj.edu.pl/xmlui/handle/item/324180

الاتاحة: https://ruj.uj.edu.pl/xmlui/handle/item/324180
https://doi.org/10.1063/5.0169830

المؤلفون: Douillard, Ludovic

المساهمون: Service de physique de l'état condensé (SPEC - UMR3680), Institut Rayonnement Matière de Saclay (DRF) (IRAMIS), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Paris-Saclay-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS), Service de Physique et de Chimie des Surfaces et Interfaces (SPCSI), Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Service de Recherche sur les Surface et l'Irradiation de la Matière (SRSIM), CEA - Commissariat à l'énergie atomique et aux énergies alternatives

المصدر: https://hal.science/hal-04487573 ; Master. Université Paris-Saclay, France, France. 2023.

مصطلحات موضوعية: Secondary Ion Mass Spectrometry SIMS, Scanning Ion Microscope SIM, Secondary Neutral Mass Spectrometry SNMS (via post-ionisation), [PHYS]Physics [physics]

جغرافية الموضوع: Université Paris-Saclay, France

Time: Université Paris-Saclay, France, France

Relation: hal-04487573; https://hal.science/hal-04487573; https://hal.science/hal-04487573/document; https://hal.science/hal-04487573/file/Spectrom%C3%A9trie%20d%20emission%20d%20ions%20secondaires.pdf

الاتاحة: https://hal.science/hal-04487573
https://hal.science/hal-04487573/document
https://hal.science/hal-04487573/file/Spectrom%C3%A9trie%20d%20emission%20d%20ions%20secondaires.pdf

المؤلفون: Alona Tynkova, Gabor L. Katona, Gabor A. Langer, Sergey I. Sidorenko, Svetlana M. Voloshko, Dezso L. Beke

المصدر: Beilstein Journal of Nanotechnology, Vol 5, Iss 1, Pp 1491-1500 (2014)

مصطلحات موضوعية: Cu/Au, grain boundary diffusion, nanofilms of intermetallic compounds, secondary neutral mass spectrometry (SNMS), solid state reaction, Technology, Chemical technology, TP1-1185, Science, Physics, QC1-999

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2190-4286

URL الوصول: https://doaj.org/article/8bed9dda1b14442fad2c467887f434dd

المؤلفون: Hisayoshi YURIMOTO, Ken-ichi BAJO, 圦本 尚義, 馬上 謙一

المصدر: レーザー研究 / The Review of Laser Engineering. 2020, 48(8):441

المؤلفون: Akinori Mogami, Makoto Kato, Motohiro Naito, 内藤 統広, 嘉藤 誠, 最上 明矩

المصدر: Journal of the Mass Spectrometry Society of Japan. 1987, 35(4):186

المؤلفون: Kiyoshi MATSUMOTO, Yasuo HAYASHI, 松本 潔, 林 泰夫

المصدر: Journal of the Mass Spectrometry Society of Japan. 1991, 39(2):93

المؤلفون: Holger JENETT, Yoshikazu KIKUTA

المصدر: Analytical Sciences. 1991, 7(5):757

المؤلفون: Holger JENETT, Yosikazu KIKUTA

المصدر: Analytical Sciences. 1992, 8(2):179

المؤلفون: Zayachuk, D.M., Slynko, V.E., Csik, A.

مصطلحات موضوعية: Secondary Neutral Mass Spectrometry, Depth Profiling, PbTe, Sputtering, Re-deposition, Вторинна нейтральна мас-спектрометрія, Профілювання вглиб, Розпорошення, Переосадження, Вторичная нейтральная масс-спектрометрия, Профилирование по глубине, Распыление, Переосаждение

وصف الملف: application/pdf

Relation: http://essuir.sumdu.edu.ua/handle/123456789/66253

الاتاحة: http://essuir.sumdu.edu.ua/handle/123456789/66253

المؤلفون: Attila Csik, V.E. Slynko, D.M. Zayachuk

مصطلحات موضوعية: Nanostructure, Materials science, Распыление, Depth Profiling, Вторинна нейтральна мас-спектрометрія, Профилирование по глубине, Nanotechnology, 02 engineering and technology, 01 natural sciences, Secondary Neutral Mass Spectrometry, Переосадження, Sputtering, 0103 physical sciences, General Materials Science, PbTe, Вторичная нейтральная масс-спектрометрия, Профілювання вглиб, 010302 applied physics, Radiation, Plasma, Розпорошення, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Re-deposition, Переосаждение, 0210 nano-technology

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1fd12fddf7c3c603895bf48a643e1fef
http://essuir.sumdu.edu.ua/handle/123456789/66253

المؤلفون: J.F. Moore, Bruce V. King, Yuelin Li, Wallis F. Calaway, Stephen V. Milton, Michael J. Pellin, Igor V. Veryovkin, Mladen Petravic, John R Lewellen

المصدر: Applied Surface Science. :962-966

مصطلحات موضوعية: Free electron model, Chemistry, Free-electron laser, Analytical chemistry, General Physics and Astronomy, secondary neutral mass spectrometry, photoionization of atoms and molecules, laser desorption, free electron laser, Surfaces and Interfaces, General Chemistry, Nova (laser), Photoionization, Condensed Matter Physics, Laser, Mass spectrometry, Surfaces, Coatings and Films, law.invention, Wavelength, law, Ionization, Atomic physics

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::40f32e51192a2e7d5192a9b1a749119d
https://doi.org/10.1016/j.apsusc.2004.03.191

المؤلفون: Alona Tynkova, Gábor Katona, Gábor A. Langer, Dezso L. Beke, Sergey I. Sidorenko, S. M. Voloshko

المصدر: Beilstein Journal of Nanotechnology
Beilstein Journal of Nanotechnology, Vol 5, Iss 1, Pp 1491-1500 (2014)

مصطلحات موضوعية: grain boundary diffusion, Materials science, Intermetallic, Analytical chemistry, General Physics and Astronomy, secondary neutral mass spectrometry (SNMS), Fizikai tudományok, lcsh:Chemical technology, Homogenization (chemistry), lcsh:Technology, Full Research Paper, Természettudományok, Perpendicular, Grain boundary diffusion coefficient, Nanotechnology, General Materials Science, lcsh:TP1-1185, Electrical and Electronic Engineering, Thin film, lcsh:Science, Cu/Au, lcsh:T, solid state reaction, nanofilms of intermetallic compounds, lcsh:QC1-999, Crystallography, Nanoscience, Grain boundary, lcsh:Q, Order of magnitude, lcsh:Physics, Solid solution

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e4972d1b6c4936e7d378b873234083ac
https://pubmed.ncbi.nlm.nih.gov/25247132

المؤلفون: Sommer, J. (Julia)

المساهمون: Wiesmann, H. (Hans-Peter), Universitäts- und Landesbibliothek Münster

مصطلحات موضوعية: Laser Secondary Neutral Mass Spectrometry, Immunfluoreszenzmikroskopie, Osteoblasten, Mineralisation, Extrazellularmatrix, Medicine and health, ddc:610

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=od_______517::9f8e6ad869102b2ea13b3d7472e69b80
https://repositorium.uni-muenster.de/transfer/miami/b3f8e36a-c28f-4fed-9e5b-9f4f21085a7b

المؤلفون: Veryovkin, Igor V., Calaway, Wallis F., Moore, Jerry F., Pellin, Michael J., Lewllen, John W., Li, Yuelin, Milton, Stephen V., King, Bruce V., Petravic, Mladen

مصطلحات موضوعية: secondary neutral mass spectrometry, photoionization of atoms and molecules, laser desorption, free electron laser

Relation: Applied Surface Science , p. 962-966; uon:2499; http://hdl.handle.net/1959.13/29245

الاتاحة: http://hdl.handle.net/1959.13/29245

المؤلفون: Sommer, Julia

مصطلحات موضوعية: Laser Secondary Neutral Mass Spectrometry, Immunfluoreszenzmikroskopie, Osteoblasten, Mineralisation, Extrazellularmatrix

Relation: vignette : https://noah.nrw/titlepage/urn/urn:nbn:de:hbz:6-79549431353/128; urn:nbn:de:hbz:6-79549431353; https://nbn-resolving.org/urn:nbn:de:hbz:6-79549431353; sys:HT015083193; system:muenster_miami_b3f8e36a-c28f-4fed-9e5b-9f4f21085a7b

الاتاحة: https://nbn-resolving.org/urn:nbn:de:hbz:6-79549431353

المؤلفون: Arlinghaus, H. F., Whitaker, T. J., Joyner, C. F., Kwoka, P., Jacobson, B.

المساهمون: ATOM SCIENCES INC OAK RIDGE TN

المصدر: DTIC AND NTIS

مصطلحات موضوعية: Atomic and Molecular Physics and Spectroscopy, MASS SPECTROMETRY, REPRINTS, LASER APPLICATIONS, SECONDARY EMISSION, SIMS(SECONDARY ION MASS SPECTROMETRY), SNMS(SECONDARY NEUTRAL MASS SPECTROMETRY), POSTIONIZATION, SIRIMP(SPUTTER INITIATED RESONANCE IONIZATION MICROPROBES)

وصف الملف: text/html

Relation: http://www.dtic.mil/docs/citations/ADA308030

الاتاحة: http://www.dtic.mil/docs/citations/ADA308030
http://oai.dtic.mil/oai/oai?&verb=getRecord&metadataPrefix=html&identifier=ADA308030

المؤلفون: Oechsner, Hans

المصدر: Scanning Microscopy

مصطلحات موضوعية: Surface, thin film and bulk analysis, Secondary Neutral Mass Spectrometry, analysis of insulating samples and thin films, charge compensation in surface and thin films analysis, Life Sciences

وصف الملف: application/pdf

Relation: https://digitalcommons.usu.edu/microscopy/vol3/iss2/2; https://digitalcommons.usu.edu/context/microscopy/article/2353/viewcontent/WDCcenterscan1989Oechsner_AnalysisInsulatorSamples.pdf

الاتاحة: https://digitalcommons.usu.edu/microscopy/vol3/iss2/2
https://digitalcommons.usu.edu/context/microscopy/article/2353/viewcontent/WDCcenterscan1989Oechsner_AnalysisInsulatorSamples.pdf

المؤلفون: Pellin, M. J., Young, C. E., Gruen, D. M.

المصدر: Scanning Microscopy

مصطلحات موضوعية: Multiphoton ionization (MPI), multiphoton resonance ionization (MPRI), resonance ionization spectroscopy (RIS), laser secondary neutral mass spectrometry (LSNMS), useful yield, sputtering, time-of-flight (TOF), mass spectrometry, isochronous, refocusing, laser ionization, nonresonant ionization, post ionization, ultrasensitive detection, Biology

وصف الملف: application/pdf

Relation: https://digitalcommons.usu.edu/microscopy/vol2/iss3/12; https://digitalcommons.usu.edu/context/microscopy/article/1559/viewcontent/WDCcenterscan1988PellinYoungGruen_MultiphotonIonizationFollowed.pdf

الاتاحة: https://digitalcommons.usu.edu/microscopy/vol2/iss3/12
https://digitalcommons.usu.edu/context/microscopy/article/1559/viewcontent/WDCcenterscan1988PellinYoungGruen_MultiphotonIonizationFollowed.pdf