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    Academic Journal
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    Academic Journal
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    Conference

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    Relation: CLEO: Applications and Technology 2023, San Jose, CA, United States 7–12 May 2023. From the session Optical Material and Device Characterization (AW4K); Technical Digest Series; AW4K.2; Ananthachar, A., Devarapu, G. C. R. and O’Faolain, L. (2023) 'High-throughput testing of the nanophotonic devices', CLEO: Applications and Technology 2023, San Jose, CA, United States, 7–12 May. Technical Digest Series (Optica Publishing Group, 2023), paper AW4K.2 (2pp). https://doi.org/10.1364/CLEO_AT.2023.AW4K.2; https://doi.org/10.1364/cleo_at.2023.aw4k.2; https://hdl.handle.net/10468/15324

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    Report