المؤلفون: Yidan Wang, Wenying He, Minzheng Duan, Hailei Liu, Hongbin Chen, Congzhen Han, Weidong Nan

المصدر: Remote Sensing, Vol 16, Iss 1, p 95 (2023)

مصطلحات موضوعية: microwave land surface emissivity, CRTM emissivity model, ground-based measurements, reflectance roughness correction, Science

وصف الملف: electronic resource

Relation: https://www.mdpi.com/2072-4292/16/1/95; https://doaj.org/toc/2072-4292

URL الوصول: https://doaj.org/article/ae4cbf5dddd14df7b7b726f400b14c77