المؤلفون: Li, Hongxia^1,2 (AUTHOR) lihongxia@yzu.edu.cn, Guo, Hongping¹ (AUTHOR) xiaoc0222@163.com, Tu, Hui^1,2 (AUTHOR), Chen, Xiao^1,2 (AUTHOR), Zeng, Xianghua^1,2 (AUTHOR) lihongxia@yzu.edu.cn

المصدر: Polymers (20734360). Oct2024, Vol. 16 Issue 20, p2902. 11p.

مصطلحات موضوعية: *RADIATION hardening (Materials), *TERRESTRIAL radiation, *RADIATION belts, *COMPOSITE materials, *SPACE environment, *RADIATION shielding

المؤلفون: Aguiar, Ygor Quadros de, Wrobel, Frédéric, Autran, Jean-Luc, García Alía, Rubén

مصطلحات موضوعية: Soft Errors from Particle to Circuits, Single Event Effects in Aerospace, Radiation Effects on Integrated Circuits and Systems, Radiation Hardening by Process, Radiation Hardening by Design, RADSAGA, thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TJ Electronics and communications engineering::TJF Electronics engineering::TJFC Electronics: circuits and components, thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TR Transport technology and trades::TRP Aerospace and aviation technology, thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TT Other technologies and applied sciences::TTD Space science::TTDS Astronautics

وصف الملف: application/pdf

URL الوصول: https://library.oapen.org/handle/20.500.12657/94673

المؤلفون: Chentian Zhou, Yuanyuan Han, Xu Cheng, Xiaoyang Zeng

المصدر: Electronics Letters, Vol 60, Iss 23, Pp n/a-n/a (2024)

مصطلحات موضوعية: integrated circuit reliability, radiation hardening (electronics), Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://doaj.org/toc/0013-5194; https://doaj.org/toc/1350-911X

URL الوصول: https://doaj.org/article/faee7d84b90640c39899e1ae1fd7e1ae

المؤلفون: Wang, Fan^1,2, Shao, Chongyun^1,2, Yu, Chunlei¹, Wang, Shikai¹, Zhang, Lei¹, Gao, Guojun³, Hu, Lili¹ hulili@siom.ac.cn

المصدر: Journal of Applied Physics. 2019, Vol. 125 Issue 17, pN.PAG-N.PAG. 6p. 2 Charts, 5 Graphs.

مصطلحات موضوعية: *FUSED silica, *RADIATION hardening (Materials), *OPTICAL properties, *SOL-gel processes, *RAMAN spectroscopy, *SINTERING

المؤلفون: LUO Aibo, LIANG Yanxiang, YAO Yong, WANG Luobin, WAN Qiang

المصدر: Cailiao gongcheng, Vol 52, Iss 5, Pp 138-147 (2024)

مصطلحات موضوعية: clam steel, helium ion irradiation, radiation hardening, nanoindentation, dbh model, fkh model, Materials of engineering and construction. Mechanics of materials, TA401-492

وصف الملف: electronic resource

Relation: http://jme.biam.ac.cn/CN/10.11868/j.issn.1001-4381.2022.000601; https://doaj.org/toc/1001-4381

URL الوصول: https://doaj.org/article/0b18e0ab26974aad8a9902caa0e43c48

المؤلفون: Novikov, V. V.¹ (AUTHOR), Plyasov, A. A.¹ (AUTHOR) alex_plyasov@mail.ru

المصدر: Physics of Atomic Nuclei. Dec2022, Vol. 85 Issue 12, p1972-1980. 9p.

مصطلحات موضوعية: *RESEARCH reactors, *RADIATION hardening (Materials), *ZIRCONIUM alloys, *HYDROGEN embrittlement of metals, *TUBES, *NUCLEAR research, *DIESEL motors

المؤلفون: Yunyi Qi, Peter Michael Gammon, Arne Benjamin Renz, Viren Kotagama, Guy William Clarke Baker, Marina Antoniou

المصدر: Power Electronic Devices and Components, Vol 8, Iss , Pp 100068- (2024)

مصطلحات موضوعية: Single event immunity, Single event effects, Schottky diode, Silicon carbide, Device simulation, Radiation hardening, Electric apparatus and materials. Electric circuits. Electric networks, TK452-454.4

وصف الملف: electronic resource

Relation: http://www.sciencedirect.com/science/article/pii/S2772370424000130; https://doaj.org/toc/2772-3704

URL الوصول: https://doaj.org/article/f50fc2947c684030a191c90ee4b01e6d

المؤلفون: BAI Na1,2;MING Tianbo1;XU Yaohua1;WANG Yi1,3;LI Yunfei1,3;LI Li2

المصدر: Yuanzineng kexue jishu, Vol 57, Iss 12, Pp 2326-2336 (2023)

مصطلحات موضوعية: circuit reliability, latch design, self-recoverability, soft error, radiation hardening, triple-node upset, Nuclear engineering. Atomic power, TK9001-9401, Nuclear and particle physics. Atomic energy. Radioactivity, QC770-798

وصف الملف: electronic resource

Relation: https://doaj.org/toc/1000-6931

URL الوصول: https://doaj.org/article/b2be9a420ce346f1933c29f746615ec6

المؤلفون: Babu, B. Hari^1,2 hariphy2012@gmail.com, Ollier, Nadège¹, Pichel, Mónica León^1,2, El Hamzaoui, Hicham³, Poumellec, Bertrand², Bigot, Laurent³, Savelii, Inna³, Bouazaoui, Mohamed³, Ibarra, Angel⁴, Lancry, Matthieu² hariphy2012@gmail.com

المصدر: Journal of Applied Physics. 2015, Vol. 118 Issue 12, p123107-1-123107-7. 7p. 1 Chart, 8 Graphs.

مصطلحات موضوعية: *RADIATION hardening (Materials), *FUSED silica, *EFFECT of radiation on glass, *RADIATION tolerance, *ERBIUM compounds, *OPTICAL properties of fused silica

المؤلفون: Mayer, Alexander E.¹ mayer.al.evg@gmail.com, Mayer, Polina N.¹

المصدر: Journal of Applied Physics. 2015, Vol. 118 Issue 3, p035903-1-035903-9. 9p. 1 Chart, 6 Graphs.

مصطلحات موضوعية: *RADIATION hardening (Materials), *INORGANIC chemistry, *COMMODITY futures, *CONTINUUM mechanics, *MINES & mineral resources, *ELECTRONIC structure

المؤلفون: Yan, Aibin¹ abyan@mail.ustc.edu.cn, Wu, Zhen¹ 2262076636@qq.com, Guo, Jing² guojing861229@163.com, Song, Jie¹ 909944599@qq.com, Wen, Xiaoqing³ wen@cse.kyutech.ac.jp

المصدر: IEEE Transactions on Reliability. Mar2019, Vol. 68 Issue 1, p354-363. 10p.

مصطلحات موضوعية: *SIMULATION methods & models, SINGLE event effects, RADIATION hardening (Electronics), ROBUST control, ENERGY dissipation, METAL oxide semiconductor field-effect transistors

المؤلفون: Daramola, Ayobami, Daniel, Fraczkiewicz, Anna, Bonny, Giovanni, Adjanor, Gilles, Monnet, Ghiath, Domain, Christophe

المساهمون: Laboratoire Georges Friedel (LGF-ENSMSE), École des Mines de Saint-Étienne (Mines Saint-Étienne MSE), Institut Mines-Télécom Paris (IMT)-Institut Mines-Télécom Paris (IMT)-Université de Lyon-Centre National de la Recherche Scientifique (CNRS), Centre d'Etude de l'Energie Nucléaire (SCK-CEN), Matériaux et Mécanique des Composants (EDF R&D MMC), EDF R&D (EDF R&D), EDF (EDF)-EDF (EDF), ANR-19-CE08-0012,HERIA,Alliages à forte entropie resistant à l'irradiation(2019)

المصدر: ISSN: 0022-3115.

مصطلحات موضوعية: Austenitic stainless steels, Radiation hardening, Molecular dynamics, Dislocation, Frank loop, Unfaulting process, Austenitic high entropy alloys, [SPI.MAT]Engineering Sciences [physics]/Materials

الاتاحة: https://hal.science/hal-04470387
https://hal.science/hal-04470387v1/document
https://hal.science/hal-04470387v1/file/AD_AF%20Journal%20of%20Nuclear%20Materials%202024.pdf
https://doi.org/10.1016/j.jnucmat.2024.154959

المؤلفون: Gil Tomás, Daniel Antonio, Saiz-Adalid, Luis-J., Gracia-Morán, Joaquín, Baraza-Calvo, Juan-Carlos, Gil, Pedro

المساهمون: Universitat Politècnica de València. Escuela Técnica Superior de Ingenieros Industriales - Escola Tècnica Superior d'Enginyers Industrials, Universitat Politècnica de València. Escola Tècnica Superior d'Enginyeria Informàtica, Agencia Estatal de Investigación

مصطلحات موضوعية: Codes, Redundancy, Error correction codes, Proposals, Random access memory, Transistors, Circuits, Radiation hardening (electronics), Error correcting codes, Random multiple-bit upsets, Radiation-hardened cells, Soft errors, Static RAM, ARQUITECTURA Y TECNOLOGIA DE COMPUTADORES

Relation: IEEE Access; info:eu-repo/grantAgreement/AEI/Plan Estatal de Investigación Científica y Técnica y de Innovación 2017-2020/PID2020-120271RB-I00/ES/ACELERADORES BASADOS EN FPGAS PARA REDES NEURONALES PROFUNDAS SUFICIENTEMENTE CONFIABLES PARA SISTEMAS DE AUTOMOCION/; https://doi.org/10.1109/ACCESS.2024.3402532; http://hdl.handle.net/10251/206458; urn:eissn:2169-3536

الاتاحة: http://hdl.handle.net/10251/206458
https://doi.org/10.1109/ACCESS.2024.3402532

المؤلفون: Yan, Aibin, Wang, Litao, Cui, Jie, Huang, Zhengfeng, Ni, Tianming, Girard, Patrick, Wen, Xiaoqing

المساهمون: Anhui University Hefei, Hefei University of Technology (HFUT), Anhui Polytechnic University, Test and dEpendability of microelectronic integrated SysTems (LIRMM, Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier (LIRMM), Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM), Kyushu Institute of Technology (Kyutech)

المصدر: ISSN: 1063-8210 ; IEEE Transactions on Very Large Scale Integration (VLSI) Systems ; https://hal-lirmm.ccsd.cnrs.fr/lirmm-04239391 ; IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2024, 32 (1), pp.116-127. ⟨10.1109/TVLSI.2023.3323562⟩.

مصطلحات موضوعية: MTJ, Fault tolerance, Radiation hardening, Double-node-upset, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics

الاتاحة: https://hal-lirmm.ccsd.cnrs.fr/lirmm-04239391
https://hal-lirmm.ccsd.cnrs.fr/lirmm-04239391v1/document
https://hal-lirmm.ccsd.cnrs.fr/lirmm-04239391v1/file/tvlsi-2023_Non-Volatile.pdf
https://doi.org/10.1109/TVLSI.2023.3323562

المؤلفون: Barbirotta, Marcello, Menichelli, Francesco, Cheikh, Abdallah, Mastrandrea, Antonio, Angioli, Marco, Olivieri, Mauro

المساهمون: Barbirotta, Marcello, Menichelli, Francesco, Cheikh, Abdallah, Mastrandrea, Antonio, Angioli, Marco, Olivieri, Mauro

مصطلحات موضوعية: termination of employment, hardware, circuit fault, fault tolerant system, computer architecture, register, digital integrated circuit, field programmable gate array, microprocessor, radiation hardening (electronics), redundancy, fault detection, fault tolerant computing, multithreading, robustness

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:001272143600001; volume:12; firstpage:95720; lastpage:95735; numberofpages:16; journal:IEEE ACCESS; https://hdl.handle.net/11573/1722549

الاتاحة: https://hdl.handle.net/11573/1722549
https://doi.org/10.1109/access.2024.3425579

المؤلفون: Shubin Zhang, Peifang Dai, Ning Li, Yanbo Chen

المصدر: Applied Sciences, Vol 14, Iss 3, p 1229 (2024)

مصطلحات موضوعية: single-event upset (SEU), triple modular redundancy (TMR), magnetic tunnel junction (MTJ), ionizing radiation, radiation hardening, Technology, Engineering (General). Civil engineering (General), TA1-2040, Biology (General), QH301-705.5, Physics, QC1-999, Chemistry, QD1-999

Relation: https://www.mdpi.com/2076-3417/14/3/1229; https://doaj.org/toc/2076-3417; https://doaj.org/article/414c431ea0f1485bb28fcf8b126329ff

الاتاحة: https://doi.org/10.3390/app14031229
https://doaj.org/article/414c431ea0f1485bb28fcf8b126329ff

المؤلفون: Sun, Xiaoyi, Meng, Xianfang, Dai, Pei, Xu, Riwei, Cheng, Anren, Guo, Yueying, Jiao, Yang, Lu, Yongjun, Wang, Liancai

المصدر: Journal of Applied Polymer Science; 9/20/2023, Vol. 140 Issue 36, p1-11, 11p

مصطلحات موضوعية: RADIATION shielding, SILICONE rubber, RADIATION hardening (Materials), GRAPHENE oxide, IRON powder, IRRADIATION, IRON composites

المؤلفون: Pavan Kumar Mukku, Rohit Lorenzo

المصدر: IEEE Access, Vol 11, Pp 96256-96271 (2023)

مصطلحات موضوعية: Critical charge, double node upset (DNU), ion track, PVT analysis, radiation hardening, sensitive node, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/10235989/; https://doaj.org/toc/2169-3536

URL الوصول: https://doaj.org/article/8e2ab40adb8449e4acdc9c83bb8a0376

المؤلفون: Pablo M. Aviles, Jose A. Belloch, Luis Entrena, Almudena Lindoso

المصدر: IEEE Access, Vol 11, Pp 128706-128723 (2023)

مصطلحات موضوعية: ARM, fault tolerance, lockstep, microprocessor, radiation hardening, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/10315116/; https://doaj.org/toc/2169-3536

URL الوصول: https://doaj.org/article/ca6727c4f2e94ea58ebc39c0b8d9b9fc

المؤلفون: Wang, Bi, Wang, Zhaohao, Hu, Chunyan, Zhao, Yuanfu, Zhang, Youguang, Zhao, Weisheng

المصدر: IEEE Transactions on Magnetics. Nov2018, Vol. 54 Issue 11, p1-5. 5p.

مصطلحات موضوعية: RADIATION hardening (Materials), SPIN-orbit coupling constants, TORQUE control, MRAM devices, MAGNETIC circuits