المؤلفون: Vali, Ava, Kramer, Philipp, Strzoda, Rainer, Comai, Sara, Gigler, Alexander M., Matteucci, Matteo

المساهمون: Vali, Ava, Kramer, Philipp, Strzoda, Rainer, Comai, Sara, Gigler, Alexander M., Matteucci, Matteo

مصطلحات موضوعية: hyperspectral imaging, zero-defect manufacturing, process residual contaminants, contaminant discrimination, foreground extraction, image segmentation

Relation: info:eu-repo/semantics/altIdentifier/isbn/9781728129891; info:eu-repo/semantics/altIdentifier/isbn/9781728129907; info:eu-repo/semantics/altIdentifier/wos/WOS:000766992600218; ispartofbook:2021 26th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA ); 26th IEEE International Conference on Emerging Technologies and Factory Automation; firstpage:1; lastpage:8; numberofpages:8; http://hdl.handle.net/11311/1202374; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85122969343

الاتاحة: http://hdl.handle.net/11311/1202374
https://doi.org/10.1109/ETFA45728.2021.9613640

المؤلفون: Philipp Kramer, Ava Vali, Sara Comai, Rainer Strzoda, Alexander M. Gigler, Matteo Matteucci

المصدر: 2021 26th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA ).

مصطلحات موضوعية: contaminant discrimination, hyperspectral imaging, hyperspectral imaging , zero-defect manufacturing , process residual contaminants , contaminant discrimination , foreground extraction , image segmentation, zero-defect manufacturing, Environmental science, Hyperspectral imaging, foreground extraction, Contamination, Residual, image segmentation, process residual contaminants, Remote sensing

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4d6ca342b404643010175c243e7a94db
https://doi.org/10.1109/etfa45728.2021.9613640