المؤلفون: Zhu, Bingke, Chen, Yingying, Tang, Ming, Wang, Jinqiao

مصطلحات موضوعية: Task analysis, Feature extraction, Anomaly detection, Transformers, Production, Inspection, Convolutional neural networks, Ind-2M, industrial image representation, Pixel-level COntrastive (PiCO), pixel-level contrastive learning, pretrainer, Engineering, Instruments & Instrumentation, Electrical & Electronic

Relation: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT; http://ir.ia.ac.cn/handle/173211/57848; http://ir.ia.ac.cn/handle/173211/57849

الاتاحة: http://ir.ia.ac.cn/handle/173211/57848
http://ir.ia.ac.cn/handle/173211/57849
https://doi.org/10.1109/TIM.2024.3353860

المؤلفون: Zhu, Bingke, Chen, Yingying, Tang, Ming, Wang, Jinqiao

مصطلحات موضوعية: Task analysis, Feature extraction, Anomaly detection, Transformers, Production, Inspection, Convolutional neural networks, Ind-2M, industrial image representation, Pixel-level COntrastive (PiCO), pixel-level contrastive learning, pretrainer, Engineering, Instruments & Instrumentation, Electrical & Electronic

Relation: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT; http://ir.ia.ac.cn/handle/173211/57847

الاتاحة: http://ir.ia.ac.cn/handle/173211/57847
https://doi.org/10.1109/TIM.2024.3353860

المؤلفون: Zhu, Bingke, Chen, Yingying, Tang, Ming, Wang, Jinqiao

مصطلحات موضوعية: Task analysis, Feature extraction, Anomaly detection, Transformers, Production, Inspection, Convolutional neural networks, Ind-2M, industrial image representation, Pixel-level COntrastive (PiCO), pixel-level contrastive learning, pretrainer, Engineering, Instruments & Instrumentation, Electrical & Electronic

Relation: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT; http://ir.ia.ac.cn/handle/173211/55908

الاتاحة: http://ir.ia.ac.cn/handle/173211/55908
https://doi.org/10.1109/TIM.2024.3353860