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1Academic Journal
المؤلفون: Burghignoli, Paolo, Lovat, Giampiero, Capolino, Filippo, Jackson, David R, Wilton, Donald R
المصدر: IEEE Transactions on Microwave Theory and Techniques. 56(5)
مصطلحات موضوعية: leaky modes, metamaterials, near field, planar slab, wire medium, Electrical and Electronic Engineering, Communications Technologies, Networking & Telecommunications
وصف الملف: application/pdf
URL الوصول: https://escholarship.org/uc/item/59d9d520
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2
المؤلفون: Vinod Kumar, Sanjeev Kumar Raghuwanshi, R. R. Pandey, Devendra Chack
المصدر: Procedia Technology. 1:286-290
مصطلحات موضوعية: Dispersion concept, Materials science, Graphical technique, business.industry, Eigenvalue equation, Planar slab optical waveguide, Mode (statistics), Physics::Optics, Computational physics, Planar, Optics, Waveguide dispersion, Polarization mode dispersion, Dispersion (optics), Slab, General Earth and Planetary Sciences, Waveguide (acoustics), business, Dielectric waveguides, General Environmental Science
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3Dissertation/ Thesis
المؤلفون: Yuskaeva, Kadriya
Thesis Advisors: Prof. Dr. Hans Werner Schürmann, Prof. Dr. Heinz- Jürgen Schmidt
مصطلحات موضوعية: TM- electromagnetic guided waves, planar slab, Kerr-like nonlinearity, spatially varying permittivity, exact dispersion relation, integral approach, nonlinear optic, ddc:530
وصف الملف: application/pdf; application/zip
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4Dissertation/ Thesis
المؤلفون: Sounas, Dimitrios, Σουνάς, Δημήτριος
مصطلحات موضوعية: Διπλο-αρνητικά υλικά, Μεταϋλικά, Επίπεδη πλάκα, Σφηνοειδής δομή, Εστίαση, Τέλειος φακός, Double-negative (DNG) materials, Metamaterials, Planar slab, Wedges, Imaging, Superlens, Επιστήμες Μηχανικού και Τεχνολογία, Επιστήμη Ηλεκτρολόγου Μηχανικού, Ηλεκτρονικού Μηχανικού, Μηχανικού Η/Υ, Engineering and Technology, Electrical Engineering, Electronic Engineering, Information Engineering
Relation: http://hdl.handle.net/10442/hedi/20531
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5Electronic Resource
المؤلفون: Burghignoli, P, Burghignoli, P, Lovat, G, Capolino, F, Jackson, DR, Wilton, DR
المصدر: IEEE Transactions on Microwave Theory and Techniques; vol 56, iss 5, 1112-1124; 0018-9480