المؤلفون: Jinyong Yu, Mengmeng Liu, Juan J. Rodriguez-Andina

المصدر: IEEE Open Journal of the Industrial Electronics Society, Vol 3, Pp 304-317 (2022)

مصطلحات موضوعية: Asynchronous fault detection, dynamic event-triggered scheme, Markov jump systems, partly accessible probabilities, zonotopic residual evaluation, Electronics, TK7800-8360, Industrial engineering. Management engineering, T55.4-60.8

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/9779981/; https://doaj.org/toc/2644-1284

URL الوصول: https://doaj.org/article/fd75fa0b63e545f6a00195619bc8283f