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1Report
المؤلفون: Guo X (Guo Xi), Wang H (Wang Hui), Jiang DS (Jiang De-Sheng), Wang YT (Wang Yu-Tian), Zhao DG (Zhao De-Gang), Zhu JJ (Zhu Jian-Jun), Liu ZS (Liu Zong-Shun), Zhang SM (Zhang Shu-Ming), Yang H (Yang Hui), Guo, X, Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China. 电子邮箱地址: guox@semi.ac.cn
مصطلحات موضوعية: Ingan, In-plane Grazing Incidence X-ray Diffraction, Reciprocal Space Mapping, Biaxial Strain, Critical Layer Thickness, Optical-properties, Lattice-constants, Gan, Heterostructures, Alloys, Wells, 光电子学, optical properties, crystal atomic structure, optical constants, optische eigen schaften, proprietes optiques, optical props, lattice constants, lattice parameters, crystal lattice parameters, gitterparameter, parametres cristallographiques, parametres reticulaires, lattice constant, metallic alloys, alkali metal alloys, alkaline earth alloys, intermetallic compounds, barium alloys
Relation: CHINESE PHYSICS B; Guo X (Guo Xi), Wang H (Wang Hui), Jiang DS (Jiang De-Sheng), Wang YT (Wang Yu-Tian), Zhao DG (Zhao De-Gang), Zhu JJ (Zhu Jian-Jun), Liu ZS (Liu Zong-Shun), Zhang SM (Zhang Shu-Ming), Yang H (Yang Hui).Evaluation of both composition and strain distributions in InGaN epitaxial film using x-ray diffraction techniques.CHINESE PHYSICS B,2010,19(10):Art. No. 106802; http://ir.semi.ac.cn/handle/172111/13906
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2Report
المؤلفون: GONG XY, YANG BH, MA YD, GAO FS, YU Y, HAN WJ, LUI XF, XI JY, WANG ZG, LIN LY, GONG XY SHIZUOKA UNIVELECTR RES INSTJOHOKU 3-5-1HAMAMATSUSHIZUOKA 432JAPAN
مصطلحات موضوعية: Room-temperature Operation, Alloy Composition, Wavelength Range, Lattice-constant, Lasers, Gasb, Gainassb, Bandgap, 半导体材料, crystal atomic structure, energy bands, lattice constants, lattice parameters, crystal lattice parameters, gitterparameter, parametres cristallographiques, parametres reticulaires, lattice constant, 粒子数布居反转, light amplification by stimulated emission of radiation, masers, optical, optical masers, population inversion, pulsed lasers, distributed bragg reflector lasers, dbr lasers, distributed feedback lasers, dfb lasers, laser tuning
Relation: JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS; GONG XY; YANG BH; MA YD; GAO FS; YU Y; HAN WJ; LUI XF; XI JY; WANG ZG; LIN LY.LIQUID-PHASE EPITAXY GROWTH AND PROPERTIES OF GAINASSB/ALGAASSB/GASB HETEROSTRUCTURES,JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS,1991,30(7):1343-1347; http://ir.semi.ac.cn/handle/172111/14283
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3Assessment of the structural properties of GaAs/Si epilayers using X-ray (004) and (220) reflections
المؤلفون: Hao MS, Wang YT, Shao CL, Soga TS, Liang JW, Jimbo T, Umeno M, Hao MS NAGOYA INST TECHNOLDEPT ELECT & COMP ENGNSHOWA KUGOKISO CHONAGOYAAICHI 466JAPAN.
مصطلحات موضوعية: 半导体物理, Lattice Constant, Misorientation, X-ray Reflection, Gaas/si Epilayer, Si, metric system, crystal atomic structure, misalignment, silicon, international metric system, international system of units, si (weights and measures), si-metric, metric unit, silicium, silizium, sudden impulse, systeme international, lattice constants, lattice parameters, crystal lattice parameters, gitterparameter, parametres cristallographiques, parametres reticulaires, spherical interaction approximation, stieltje imaging, state interaction method, x ray reflection, x ray back reflection
Relation: JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS; Hao MS; Wang YT; Shao CL; Soga TS; Liang JW; Jimbo T; Umeno M .Assessment of the structural properties of GaAs/Si epilayers using X-ray (004) and (220) reflections ,JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS,1996,35(12A):6017-6018; http://ir.semi.ac.cn/handle/172111/15285