يعرض 1 - 8 نتائج من 8 نتيجة بحث عن '"optical device characterization"', وقت الاستعلام: 0.39s تنقيح النتائج
  1. 1
    Conference
    Emerging trends in OBIC characterization technique for Wide Bandgap semiconductor devices

    المؤلفون: Planson, Dominique, Sonneville, Camille, Bevilacqua, Pascal, Tournier, Dominique

    المساهمون: Ampère, Département Energie Electrique (EE), Ampère (AMPERE), École Centrale de Lyon (ECL), Université de Lyon-Université de Lyon-Université Claude Bernard Lyon 1 (UCBL), Université de Lyon-Institut National des Sciences Appliquées de Lyon (INSA Lyon), Université de Lyon-Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)-Institut National de Recherche pour l’Agriculture, l’Alimentation et l’Environnement (INRAE)-École Centrale de Lyon (ECL), Université de Lyon-Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)-Institut National de Recherche pour l’Agriculture, l’Alimentation et l’Environnement (INRAE), IMT Bucharest

    المصدر: International Semiconductor Conference (CAS-2023) ; https://hal.science/hal-04238355 ; International Semiconductor Conference (CAS-2023), IMT Bucharest, Oct 2023, Sinaia, Romania. pp.3-10, ⟨10.1109/CAS59036.2023.10303647⟩

    مصطلحات موضوعية: optical device characterization, power devices, high voltage device, periphery protection, Silicon Carbide, OBIC, [SPI.NRJ]Engineering Sciences [physics]/Electric power

    جغرافية الموضوع: Sinaia, Romania

    Relation: hal-04238355; https://hal.science/hal-04238355; https://hal.science/hal-04238355/document; https://hal.science/hal-04238355/file/obic_planson.pdf

    الاتاحة: https://hal.science/hal-04238355
    https://hal.science/hal-04238355/document
    https://hal.science/hal-04238355/file/obic_planson.pdf
    https://doi.org/10.1109/CAS59036.2023.10303647

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  2. 2
    Conference
    Experimental and simulation results of OBIC Technique Applied to Wide Bandgap Semiconductors

    المؤلفون: Planson, Dominique, Phung, Luong-Viet, Asllani, Besar, Bevilacqua, Pascal, Hamad, Hassan, Raynaud, Christophe

    المساهمون: Ampère, Département Energie Electrique (EE), Ampère (AMPERE), École Centrale de Lyon (ECL), Université de Lyon-Université de Lyon-Université Claude Bernard Lyon 1 (UCBL), Université de Lyon-Institut National des Sciences Appliquées de Lyon (INSA Lyon), Université de Lyon-Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)-Institut National de Recherche pour l’Agriculture, l’Alimentation et l’Environnement (INRAE)-École Centrale de Lyon (ECL), Université de Lyon-Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)-Institut National de Recherche pour l’Agriculture, l’Alimentation et l’Environnement (INRAE), Institut National des Sciences Appliquées de Lyon (INSA Lyon), Université de Lyon-Institut National des Sciences Appliquées (INSA)

    المصدر: e-MRS Fall Meeting ; https://hal.science/hal-02116919 ; e-MRS Fall Meeting, Sep 2018, Varsovie, Poland

    مصطلحات موضوعية: optical device characterization, power devices, Silicon Carbide, Gallium Nitride, Diamond, [SPI.NRJ]Engineering Sciences [physics]/Electric power

    جغرافية الموضوع: Varsovie, Poland

    Relation: hal-02116919; https://hal.science/hal-02116919; https://hal.science/hal-02116919/document; https://hal.science/hal-02116919/file/cgri_71_hal.pdf

    الاتاحة: https://hal.science/hal-02116919
    https://hal.science/hal-02116919/document
    https://hal.science/hal-02116919/file/cgri_71_hal.pdf

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  3. 3
    Academic Journal
    Experimental and simulation results of optical beam induced current technique applied to wide bandgap semiconductors

    المؤلفون: Planson, Dominique, Asllani, Besar, Phung, Luong-Viet, Bevilacqua, Pascal, Hamad, Hassan, Raynaud, Christophe

    المساهمون: Ampère, Département Energie Electrique (EE), Ampère (AMPERE), École Centrale de Lyon (ECL), Université de Lyon-Université de Lyon-Université Claude Bernard Lyon 1 (UCBL), Université de Lyon-Institut National des Sciences Appliquées de Lyon (INSA Lyon), Université de Lyon-Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)-Institut National de Recherche pour l’Agriculture, l’Alimentation et l’Environnement (INRAE)-École Centrale de Lyon (ECL), Université de Lyon-Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)-Institut National de Recherche pour l’Agriculture, l’Alimentation et l’Environnement (INRAE)

    المصدر: ISSN: 1369-8001 ; Materials Science in Semiconductor Processing ; https://hal.science/hal-02053053 ; Materials Science in Semiconductor Processing, 2019, 94, pp.116-127. ⟨10.1016/j.mssp.2019.01.042⟩.

    مصطلحات موضوعية: optical device characterization, power devices, Silicon Carbide, Gallium Nitride, Diamond, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics

    Relation: hal-02053053; https://hal.science/hal-02053053; https://hal.science/hal-02053053/document; https://hal.science/hal-02053053/file/full_paper_BA_vff.pdf

    الاتاحة: https://hal.science/hal-02053053
    https://hal.science/hal-02053053/document
    https://hal.science/hal-02053053/file/full_paper_BA_vff.pdf
    https://doi.org/10.1016/j.mssp.2019.01.042

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  4. 4
    Experimental and simulation results of optical beam induced current technique applied to wide bandgap semiconductors

    المؤلفون: Luong-Viet Phung, Dominique Planson, Besar Asllani, Hassan Hamad, Christophe Raynaud, Pascal Bevilacqua

    المساهمون: Ampère, Département Energie Electrique (EE), Ampère (AMPERE), École Centrale de Lyon (ECL), Université de Lyon-Université de Lyon-Université Claude Bernard Lyon 1 (UCBL), Université de Lyon-Institut National des Sciences Appliquées de Lyon (INSA Lyon), Université de Lyon-Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)-Institut National de Recherche pour l’Agriculture, l’Alimentation et l’Environnement (INRAE)-École Centrale de Lyon (ECL), Université de Lyon-Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)-Institut National de Recherche pour l’Agriculture, l’Alimentation et l’Environnement (INRAE)

    المصدر: Materials Science in Semiconductor Processing
    Materials Science in Semiconductor Processing, Elsevier, 2019, 94, pp.116-127. ⟨10.1016/j.mssp.2019.01.042⟩

    مصطلحات موضوعية: Materials science, Optical beam-induced current, Gallium nitride, 02 engineering and technology, 01 natural sciences, chemistry.chemical_compound, 0103 physical sciences, Silicon carbide, General Materials Science, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, 010302 applied physics, power devices, Silicon Carbide, business.industry, Mechanical Engineering, Wide-bandgap semiconductor, Schottky diode, High voltage, Semiconductor device, Carrier lifetime, 021001 nanoscience & nanotechnology, Condensed Matter Physics, optical device characterization, Gallium Nitride, chemistry, Mechanics of Materials, Optoelectronics, Diamond, 0210 nano-technology, business

    URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2325c3ad8e52515a2ea28df2910197da
    https://hal.archives-ouvertes.fr/hal-02053053/document

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  5. 5
    Conference
    Effects of uncertainties in the characterization of multi-mode fiber excitation conditions

    المؤلفون: OLIVERO, MASSIMO, PERRONE, Guido, VALLAN, Alberto

    المساهمون: Olivero, Massimo, Perrone, Guido, Vallan, Alberto

    مصطلحات موضوعية: Multi-mode Fiber, Optical Device Characterization, Optical Fiber, Optical measurement, Mode Scrambler, Uncertainty, IEC standards

    وصف الملف: STAMPA

    Relation: info:eu-repo/semantics/altIdentifier/isbn/9781424433520; info:eu-repo/semantics/altIdentifier/isbn/9781424433537; info:eu-repo/semantics/altIdentifier/wos/WOS:000277153600059; ispartofbook:Instrumentation and Measurement Technology Conference, 2009. I2MTC '09. IEEE; Instrumentation and Measurement Technology Conference, 2009. I2MTC '09. IEEE; firstpage:305; lastpage:308; numberofpages:4; http://hdl.handle.net/11583/1958091; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-70450065511

    الاتاحة: http://hdl.handle.net/11583/1958091
    https://doi.org/10.1109/IMTC.2009.5168464

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  6. 6
    Academic Journal
    Near-Field Measurements and Mode Power Distribution of Multimode Optical Fibers

    المؤلفون: OLIVERO, MASSIMO, PERRONE, Guido, VALLAN, Alberto

    المساهمون: Olivero, Massimo, Perrone, Guido, Vallan, Alberto

    مصطلحات موضوعية: Mode scramblers (MSs), multimode fibers (MMFs), optical device characterization, optical fiber, optical measurements

    وصف الملف: STAMPA

    Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000276416100046; volume:59; issue:5; firstpage:1382; lastpage:1388; numberofpages:7; journal:IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT; http://hdl.handle.net/11583/2362711; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-77950917044; http://ieeexplore.ieee.org

    الاتاحة: http://hdl.handle.net/11583/2362711
    https://doi.org/10.1109/TIM.2010.2040933
    http://ieeexplore.ieee.org

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  7. 7
    Near-Field Measurements and Mode Power Distribution of Multimode Optical Fibers

    المؤلفون: Massimo Olivero, Alberto Vallan, Guido Perrone

    مصطلحات موضوعية: Mode scramblers (MSs), Multi-mode optical fiber, Optical fiber, optical fibers, Noise measurement, Computer science, Mode (statistics), multimode fibers (MMFs), optical device characterization, Transfer function, optical measurements, law.invention, Modal, law, Optical transfer function, Electronic engineering, Electrical and Electronic Engineering, Image sensor, Instrumentation

    URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a15a59448731696d6a8b66be66b95fc6
    http://hdl.handle.net/11583/2362711

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  8. 8
    Effects of uncertainties in the characterization of multi-mode fiber excitation conditions

    المؤلفون: Massimo Olivero, Guido Perrone, Alberto Vallan

    المصدر: 2009 IEEE Intrumentation and Measurement Technology Conference.

    مصطلحات موضوعية: Physics, Multi-mode optical fiber, Optical fiber, Optical Device Characterization, business.industry, Multi-mode Fibers, Optical Fibers, Optical measurements, Mode Scramblers, Uncertainty, IEC standards, Near and far field, Image processing, law.invention, Optics, law, Optical transfer function, Calibration, Measurement uncertainty, business, Excitation

    URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0f1fc4d2940846487f0ba496ddaab9be
    https://doi.org/10.1109/imtc.2009.5168464

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