المؤلفون: Caddemi A., Cardillo E., Crupi G., Boglione L., Roussos J.

المساهمون: Caddemi, A., Cardillo, E., Crupi, G., Boglione, L., Roussos, J.

مصطلحات موضوعية: Low-noise characterization, Microwave, Noise figure, On-wafer GaAs pHEMT

وصف الملف: ELETTRONICO

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000502269500161; volume:8; issue:11; firstpage:1; lastpage:13; numberofpages:13; journal:ELECTRONICS; http://hdl.handle.net/11570/3147725; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85075228728; https://www.mdpi.com/2079-9292/8/11/1365/pdf

الاتاحة: http://hdl.handle.net/11570/3147725
https://doi.org/10.3390/electronics8111365
https://www.mdpi.com/2079-9292/8/11/1365/pdf

المؤلفون: Emanuele Cardillo, J.A. Roussos, Alina Caddemi, Giovanni Crupi, Luciano Boglione

المصدر: IEEE Transactions on Microwave Theory and Techniques. 69:1733-1739

مصطلحات موضوعية: Test bench, Radiation, Noise measurement, Equivalent-circuit model, microwaves, noise figure measurement, noise parameters' extraction, on-wafer GaAs pHEMT, transistor characterization, Computer science, Transistor, 020206 networking & telecommunications, Tuner, 02 engineering and technology, Condensed Matter Physics, Noise (electronics), law.invention, law, Logic gate, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Extraction (military), Electrical and Electronic Engineering, Microwave

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b080dc60607bfaa04363edab02641ed3
https://doi.org/10.1109/tmtt.2020.2999780

المؤلفون: Caddemi A., Boglione L., Cardillo E., Crupi G., Roussos J. A.

المساهمون: Caddemi, A., Boglione, L., Cardillo, E., Crupi, G., Roussos, J. A.

مصطلحات موضوعية: Equivalent-circuit model, microwave, noise figure measurement, noise parameters' extraction, on-wafer GaAs pHEMT, transistor characterization

وصف الملف: STAMPA

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000626557300026; volume:69; issue:3; firstpage:1733; lastpage:1739; numberofpages:7; journal:IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES; https://hdl.handle.net/11570/3194371; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85101387973

الاتاحة: https://hdl.handle.net/11570/3194371
https://doi.org/10.1109/TMTT.2020.2999780

المؤلفون: Alina Caddemi, J.A. Roussos, Giovanni Crupi, Luciano Boglione, Emanuele Cardillo

المصدر: Electronics, Vol 8, Iss 11, p 1365 (2019)
Electronics
Volume 8
Issue 11

مصطلحات موضوعية: microwave, Computer Networks and Communications, Computer science, lcsh:TK7800-8360, 02 engineering and technology, Noise figure, Low-noise characterization, Microwave, On-wafer GaAs pHEMT, law.invention, on-wafer gaas phemt, law, 0202 electrical engineering, electronic engineering, information engineering, Calibration, Electronic engineering, Wafer, Electrical and Electronic Engineering, noise figure, 020208 electrical & electronic engineering, Transistor, lcsh:Electronics, 020206 networking & telecommunications, Tuner, Characterization (materials science), Electric power transmission, Hardware and Architecture, Control and Systems Engineering, Signal Processing, low-noise characterization

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5fdbd83a5fc1a2e60604b6af3b3150b4
https://www.mdpi.com/2079-9292/8/11/1365